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Analytical modeling of coil impedance based on truncated region eigenfunction expansion method in eddy current tube inspection

Fan Meng-Bao Yin Ya-Dan Cao Bing-Hua

Analytical modeling of coil impedance based on truncated region eigenfunction expansion method in eddy current tube inspection

Fan Meng-Bao, Yin Ya-Dan, Cao Bing-Hua
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Publishing process
  • Received Date:  26 June 2011
  • Accepted Date:  28 April 2012
  • Published Online:  20 April 2012

Analytical modeling of coil impedance based on truncated region eigenfunction expansion method in eddy current tube inspection

  • 1. College of Mechanical and Electrical Engineering, China University of Mining and Technology, Xuzhou 221116, China;
  • 2. College of Information and Electrical Engineering, China University of Mining and Technology, Xuzhou 221116, China
Fund Project:  Project supported by the National High Technology Research and Development Program of China (Grant No. 2008AA062202), the China Postdoctoral Science Foundation (Grant Nos. 20090460086, 201003606), and the Natural Science Foundation for Young Scholar of China Univeristy of Mining and Technology (Grant No. 2009A018).

Abstract: In order to calculate theoretically the coil impedance, the separation of variables method and the Cheng matrix method are used to establish the analytical model by applying the magnetic insulation condition in eddy current tube detection with encircling probes inside and outside respectively. In the established model, there exists a definite integral related to modified Bessel function. Gaussian integral algorithm is proposed to accurately perform the numerical calculation. Simulations are carried out on the thinning of a copper tube wall thickness using the presented model, traditional Dodd model and finite element model. Their results are in good agreement with each other, demonstrating that the derived analytical model is correct. Compared with the Dodd and finite element models, the improved model has some advantages such as good efficiency, easy adjustment of accuracy and so on.

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