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Characterization of elastic properties of a sample by atomic force microscope higher harmonic amplitude

Zhang Wei-Ran Li Ying-Zi Wang Xi Wang Wei Qian Jian-Qiang

Characterization of elastic properties of a sample by atomic force microscope higher harmonic amplitude

Zhang Wei-Ran, Li Ying-Zi, Wang Xi, Wang Wei, Qian Jian-Qiang
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  • Received Date:  22 January 2013
  • Accepted Date:  27 March 2013
  • Published Online:  20 July 2013

Characterization of elastic properties of a sample by atomic force microscope higher harmonic amplitude

  • 1. Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Department of Applied Physics, Beihang University, Beijing 100191, China
Fund Project:  Project supported by the National Natural Science Foundation of China (Grant No. 11074019) and the Beijing Natural Science Foundation, China (Grant No. 4132038).

Abstract: When the atomic force microscope cantilever in tapping-mode is vibrated at a frequency close to its fundamental resonance frequency, the tip on its free end will be close to and away from the sample periodically. The higher harmonic signals produced by non-linear interactions between the tip and sample surface contain more nanomechanical information. We study the influence on the contact time by different elastic modulus and the relationship between higher harmonic amplitude and contact time. By theoretical analysis and calculation, we obtain the law of characterizing the sample surface elastic difference with the higher harmonic amplitude. Moreover, we obtain the experimental result consistent with the theory, on our homemade higher harmonic system.

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