Zhang Zhan-Gang, Yang Shao-Hua, Lin Qian, Lei Zhi-Feng, Peng Chao, He Yu-Juan. Experimental study on real-time measurement of single-event effects of 14 nm FinFET and 28 nm planar CMOS SRAMs based on Qinghai-Tibet PlateauJ. Acta Physica Sinica, 2023, 72(14): 146101. DOI: 10.7498/aps.72.20230161
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Citation:
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Zhang Zhan-Gang, Yang Shao-Hua, Lin Qian, Lei Zhi-Feng, Peng Chao, He Yu-Juan. Experimental study on real-time measurement of single-event effects of 14 nm FinFET and 28 nm planar CMOS SRAMs based on Qinghai-Tibet PlateauJ. Acta Physica Sinica, 2023, 72(14): 146101. DOI: 10.7498/aps.72.20230161
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Zhang Zhan-Gang, Yang Shao-Hua, Lin Qian, Lei Zhi-Feng, Peng Chao, He Yu-Juan. Experimental study on real-time measurement of single-event effects of 14 nm FinFET and 28 nm planar CMOS SRAMs based on Qinghai-Tibet PlateauJ. Acta Physica Sinica, 2023, 72(14): 146101. DOI: 10.7498/aps.72.20230161
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Citation:
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Zhang Zhan-Gang, Yang Shao-Hua, Lin Qian, Lei Zhi-Feng, Peng Chao, He Yu-Juan. Experimental study on real-time measurement of single-event effects of 14 nm FinFET and 28 nm planar CMOS SRAMs based on Qinghai-Tibet PlateauJ. Acta Physica Sinica, 2023, 72(14): 146101. DOI: 10.7498/aps.72.20230161
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