Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Correlation among magnetic properties, perpendicular magnetic recording properti es and microstructure of[Co8585Cr1515/Pt]2020 multilayers

Yang Tao Zhai Zhong-Hai Zhu Feng-Wu Li Bao-He Hwang Pol

Correlation among magnetic properties, perpendicular magnetic recording properti es and microstructure of[Co8585Cr1515/Pt]2020 multilayers

Yang Tao, Zhai Zhong-Hai, Zhu Feng-Wu, Li Bao-He, Hwang Pol
PDF
Get Citation
Metrics
  • Abstract views:  2909
  • PDF Downloads:  926
  • Cited By: 0
Publishing process
  • Received Date:  21 September 2004
  • Accepted Date:  01 November 2004
  • Published Online:  19 April 2005

Correlation among magnetic properties, perpendicular magnetic recording properti es and microstructure of[Co8585Cr1515/Pt]2020 multilayers

  • 1. (1)北京科技大学材料物理与化学系,北京 100083; (2)北京科技大学材料物理与化学系,北京 100083;北京工商大学数理部,北京 100037; (3)北京科技大学材料物理与化学系,北京 100083;金日成综合大学物理系,朝鲜平壤

Abstract: The [Co8585Cr1515/Pt]2020 multilayers w ith Pt underlayers were prepared by magnetron sputtering and the effects of sputtering Ar gas pressure on m icrostructure and magnetic properties of [Co8585Cr1515 /Pt]2020 mul tilayers were studied. The results show that sputtering Ar gas pressure has a gr eat effect on the microstructure, perpendicular magnetic anisotropy and the coer civity of [Co8585Cr1515/Pt]2020 mul tilayers. For all samples, we have the effective magnetic anisotropy constant K effeff>0, and all s amples showed perpendicular magnetic anisotropy. With increasing sputtering Ar g as pressure, the perpendicular and in-plane coercivity of the samples increase, but the effective magnetic anisotropy constant decreases. The coercivity of Pt( 20nm)/[(Co8585Cr1515(05nm)/Pt(15nm)]2020 multilayers spu tter-depositied at 16Pa Ar gas pressures is increased to 130kA/m. The Pt( 20nm)/[(Co8585Cr1515(05nm)/Pt(15nm)] 2020 multilayers display perpendicular magnetic anisotropy and can be used as perpendicular magn etic recording media. The images of atomic force microscopy show that both avera ge grain size and the surface roughness increase with increasing sputtering Ar p ressure, which leads to the enhancement of perpendicular coercivity and the decr ease of effective magnetic anisotropy constant.

Catalog

    /

    返回文章
    返回