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Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer

Liu Yong-Jun Hu Li-Fa Li Da-Yu Cao Zhao-Liang Xuan Li Mu Quan-Quan

Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer

Liu Yong-Jun, Hu Li-Fa, Li Da-Yu, Cao Zhao-Liang, Xuan Li, Mu Quan-Quan
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  • Received Date:  31 March 2005
  • Accepted Date:  01 August 2005
  • Published Online:  20 March 2006

Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer

  • 1. (1)中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,长春 130033; (2)中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,长春 130033;中国科学院研究生院,北京 100049

Abstract: Spectroscopic ellipsometry is widely used in measuring the refractive index and thickness of optical isotropic thin layers. A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced. A UVISEL spectroscopic phase modulated ellipsometer is used to measure the ordinary refractive index, extraordinary refractive index and thickness of the liquid crystal layer in a parallel-aligned liquid crystal cell. The phase retardation Δnd is measured in transmission mode. The results show that the spectroscopic ellipsometry can be used to measure the anisotropic multilayer liquid crystal cell with high precision.

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