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Characteristics of dielectric resonators for high-transition-temperature radio frequency superconducting quantum interference devices

Gao Ji Yang Tao Ma Ping Dai Yuan-Dong

Characteristics of dielectric resonators for high-transition-temperature radio frequency superconducting quantum interference devices

Gao Ji, Yang Tao, Ma Ping, Dai Yuan-Dong
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Publishing process
  • Received Date:  10 November 2009
  • Accepted Date:  01 December 2009
  • Published Online:  15 July 2010

Characteristics of dielectric resonators for high-transition-temperature radio frequency superconducting quantum interference devices

  • 1. State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China

Abstract: At present, the high-transition-temperature radio frequency superconducting quantum interference device (High- T c RF SQUID) is usually coupled to a dielectric resonator which is a standard 10 mm×10 mm× 1 mm SrTiO3 (STO) substrate with a YBa2Cu3O7-δ (YBCO) thin-film flux focuser deposited on it. The dielectric resonator for the High- Tc RF SQUID has a high quality factor and a resonant frequency in the microwave range. In order to find out the effect of the flux focuser’s geometry on the dielectric resonator’s resonant frequency, we used ANSOFT high frequency structure simulator (ANSOFT HFSS) to simulate the resonance characteristics of some dielectric resonators with different flux focuser geometries. Our simulation results show that when the width of the flux focuser’s slit increases or the radius of the flux focuser’s inner hole decreases, the dielectric resonator’s resonant frequency increases. To estimate the reliability of our simulation results, we selectively prepared a few dielectric resonators and measured their resonance characteristics. The experimental results are virtually consistent with the simulation results. Our study shows that changing the flux focuser geometry is an effective way to adjust the dielectric resonator’s resonant frequency.

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