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中国物理学会期刊
Bi Juan, Zhang Xi-He, Ni Xiao-Wu. Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor. Acta Physica Sinica, 2011, 60(11): 114210. DOI: 10.7498/aps.60.114210
Citation: Bi Juan, Zhang Xi-He, Ni Xiao-Wu. Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor. Acta Physica Sinica, 2011, 60(11): 114210. DOI: 10.7498/aps.60.114210

Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor

CSTR: 32037.14.aps.60.114210
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