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Statistical power consumption of RC interconnect tree with process fluctuation

Dong Gang Xue Meng Li Jian-Wei Yang Yin-Tang

Statistical power consumption of RC interconnect tree with process fluctuation

Dong Gang, Xue Meng, Li Jian-Wei, Yang Yin-Tang
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Publishing process
  • Received Date:  18 March 2010
  • Accepted Date:  22 October 2010
  • Published Online:  15 March 2011

Statistical power consumption of RC interconnect tree with process fluctuation

  • 1. Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, Microelectronics Institute, Xidian University, Xian 710071, China

Abstract: In order to effectively analyze the statistical power consumption of RC interconnect tree with process fluctuation, a method of constructing interconnect parasitic parameters and driving point admittance moments is first presented in this paper. Then, the expressions of mean and standard deviations of interconnect power consumption are obtained. The calculation results indicate that the errors of mean and standard deviations are less than 4.36 % and 6.68 % respectively compared with those calculated by the widely used Monte Carlo method. Results show that the proposed method has a good accuracy and high efficiency.

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