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Dielectric layer equivalent capacitance and loading performance of a coaxial dielectric barrier discharge reactor

Zhao Kai Mu Zong-Xin Zhang Jia-Liang

Dielectric layer equivalent capacitance and loading performance of a coaxial dielectric barrier discharge reactor

Zhao Kai, Mu Zong-Xin, Zhang Jia-Liang
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  • PDF Downloads:  858
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  • Received Date:  27 March 2014
  • Accepted Date:  06 May 2014
  • Published Online:  20 September 2014

Dielectric layer equivalent capacitance and loading performance of a coaxial dielectric barrier discharge reactor

  • 1. Key Laboratory of Materials Modification by Laser, Ion and Electron Beams of Ministry of Education, School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024, China
Fund Project:  Project supported by the National Natural Science Foundation of China (Grant Nos. 21173110, 11375041).

Abstract: Dielectric barrier discharge (DBD) can produce non-equilibrium plasma at atmospheric pressure, and it has become a hot point in recent years. For the DBD excited by pulsed or alternated currents, the effects of the loading performance of power supply, the matching between supply and discharge reactor and the discharge phenomena on its discharge are interesting issues. The studies of these issues are of great importance for understanding the DBD processes and improving the power supply efficiency. In this paper, the Lissajous figures of a DBD reactor with coaxial electrode configuration are measured. The loading performance of the DBD reactor and the dependences of excitation voltage and air flow rate on the dielectric layer equivalent capacitance are studied in atmospheric air. According to the experimental data and circuit modeling analysis, it is proved that the dielectric layer capacitance decreases with the increase of air flow rate, but increases with the increase of excitation voltage. The amplitude-frequency performance of the reactor reveals significant RLC circuit resonance. The resonance frequency of the reactor has the same behavior as its dielectric layer capacitance. Therefore it shows that the dielectric layer capacitance is the main factor for the resonance frequency evolution. A possible mechanism responsible for the dielectric layer capacitance is also presented.

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