We present here a method of solving the simultaneous equations for obtaining lattice constants of low-symmetry crystal systems (triclinic, monoclinic and orthorhombic systems) by using all available diffraction data. Due to the measuring error, about 10 per cent of the data would show larger diviation. But most of the data are rather accurate and still distribute close to the true value statistically. Therefore, using a certain pro-grammed method for reasonable selection of data the best result of average values of lat-tice constant can be obtained.
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