Measurement of thickness and refractive index of Zn<sub>1-<i>x</i></sub>Mg<sub><i>x</i></sub>O film grown on sapphire substrate by molecular beam epitaxy
Acta Physica Sinica
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Acta Phys. Sin.  2007, Vol. 56 Issue (7): 4127-4131    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Measurement of thickness and refractive index of Zn1-xMgxO film grown on sapphire substrate by molecular beam epitaxy
K. Ogata1, K. Koike2, S. Sasa3, M. Inoue3, M. Yano3, Zheng Kai4, Wang Lin4, Li Yi-Fan4, Gong Tao-Rong4, Jian Shui-Sheng4, Yan Feng-Ping5
(1)Bio Venture Center,Osaka Institute of Technology; (2)New Material Research Center,Osaka Institute of Technology; (3)New Material Research Center,Osaka Institute of Technology;Bio Venture Center,Osaka Institute of Technology; (4)北京交通大学光波技术研究所,北京 100044; (5)北京交通大学光波技术研究所,北京 100044;New Material Research Center,Osaka Institute of Technology
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