Coupling scattering effect between grain boundary and point defect on the thermoelectric transport process in Co<sub>1-<i>x</i></sub>Ni<sub><i>x</i></sub>Sb<sub>3-<i>y</i></sub>Se<sub><i>y</i></sub>
Acta Physica Sinica
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Acta Phys. Sin.  2008, Vol. 57 Issue (6): 3791-3797    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Coupling scattering effect between grain boundary and point defect on the thermoelectric transport process in Co1-xNixSb3-ySey
Zhang Bo-Ping1, Zhang Hai-Long1, Zhao Li-Dong1, Liu Wei-Shu2, Li Jing-Feng3
(1)北京科技大学材料科学与工程学院无机非金属材料系,北京 100083; (2)北京科技大学材料科学与工程学院无机非金属材料系,北京 100083;清华大学材料科学与工程系新型陶瓷与精细工艺国家实验室,北京 100084; (3)清华大学材料科学与工程系新型陶瓷与精细工艺国家实验室,北京 100084
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