Raman spectral analysis of TiO<sub>2</sub> thin films doped with rare-earth yttrium and lanthanum
Acta Physica Sinica
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Acta Phys. Sin.  2010, Vol. 59 Issue (9): 6549-6555    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Raman spectral analysis of TiO2 thin films doped with rare-earth yttrium and lanthanum
Ma Zhong-Quan1, Xu Fei1, Zhao Lei1, Li Feng1, He Bo1, Yang Chang-Hu2
(1)SHU-SOEN's R&D Lab, Department of Physics, Shanghai University, Shanghai 200444, China; (2)SHU-SOEN's R&D Lab, Department of Physics, Shanghai University, Shanghai 200444, China;School of Physics and Electronic Science, Changsha University of Science and Technology, Changsha 410004, China
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