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Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase

Xu Xiao-Ming Miao Wei Tao Kun

Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase

Xu Xiao-Ming, Miao Wei, Tao Kun
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  • Abstract views:  1445
  • PDF Downloads:  626
  • Cited By: 0
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  • Received Date:  03 November 2010
  • Accepted Date:  24 February 2011
  • Published Online:  15 August 2011

Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase

  • 1. Center for Testing and Analyzing of Materials, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China

Abstract: A new method of determining lattice parameters by peak fitting of X-ray diffraction pattern, without involving structure parameters, is introduced. The method can be applied to a single phase and one phase in multi-phase diffraction patterns. It can avoid getting different fitting results caused by using different extrapolation functions, and can get a more accurate result in a short time. The application program of the method has been used in the practical work. For improving the fitting accuracy, the program can also adjust off-axis deviation of the sample surface and the goniometric mechanical zero.

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