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The fault-tolerance study of QCA adder based on probability model

Huang Hong-Tu Cai Li Yang Xiao-Kuo Liu Bao-Jun Li Zheng-Cao

The fault-tolerance study of QCA adder based on probability model

Huang Hong-Tu, Cai Li, Yang Xiao-Kuo, Liu Bao-Jun, Li Zheng-Cao
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  • Abstract views:  1568
  • PDF Downloads:  388
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Publishing process
  • Received Date:  14 May 2011
  • Accepted Date:  21 June 2011
  • Published Online:  05 March 2012

The fault-tolerance study of QCA adder based on probability model

  • 1. College of Science, Air Force Engineering University, Xi'an 710051, China
Fund Project:  Project supported by the National Natural Science Foundation of China (Grant No. 61172043), the Key Program of Shanxi Provincial Natural Science Research Foundation for Basic Research, China (Grant No. 2011JZ015), and the Research Fund of Shanxi Key Laboratory of Electronic Information System Integration, China (Grant No. 201115Y15).

Abstract: The probability models of 2 different quantum cellular automaton (QCA) adders are based on the theory of probabilistic transfer matrix and circuit partition. The effect of individual component on the overall fault-tolerance is fully analyzed at the same level. The simulation shows that the effect of the wire is minor when the success probability is low, while the overall fault-tolerance rises sharply once the success probability is high. And the inverter is considered to be a major factor that affects the overall fault-tolerance in the variation range of parameter. Frobenbius norm of the overall error probabilistic transfer matrix is employed to study the fault-tolerance difference. The result shows that the overall fault-tolerance of QCA adder consisting of 5-input majority is superior to the other. Such fault-tolerance analyses should be used for a better characterization of QCA circuit design and fault-tolerance improvement.

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