Enhanced chromaticity of organic electroluminescence from siliconbased organic microcavity

Xiong Zu-Hong; Shi Hua-Zhong; Fan Yong-Liang; Zhang Song-Tao; Zhan Yi-Qiang; He Jun; Zhong Gao-Yu; Xu Shao-Hui; Liu Yi; Wang Xiao-Jun; Wang Zi-Jun; Ding Xun-Min; Huang Wei; Hou XiaoYuan

doi:10.7498/aps.52.1222

Abstract
Electroluminescence (EL) from Sibased organic microcavity has firstly been reported in the literature. The microcavity is made up of the central active multilayers sandwiched between a silver film and a porous silicon Bragg reflector (PSDBR), formed by electrochemical etching of p+Si substrate in the electrolyte of HF: C2H5OH:H2O. The central active multilayers consist of Al (1 nm) / LiF (05 nm) / Alq3 / Alq3: DCJTB / NPB / CuPc / ITO / SiO2． The reflectivity (relative to an Al mirror) of the PSDBR is up to 99%, and the stopband is about 160 nm wide. Resonant cavity mode appears as a tip in the reflectivity spectrum of the Sibased organic multilayer films, indicating that the Sibased organic multilayer structure is indeed a microcavity. The peak widths of the EL spetra are greatly reduced from 70 nm to 12 nm as compared with those measured from noncavity structures. Note that the EL emission from the cavity devices is singlemode, and the offresonant optical modes are highly suppressed. Moreover, an increase of a factor of about 4 of the resonant peak intensity is observed. In addition, the currentbrightnessvoltage characteristics and the effect of parameters on the lifetime of the cavity devices are also discussed. The present technique for obtaining enhanced EL emission from Sibased organic microcavity may also be another novel effective method for realizing allSibased photonic devices and optoelectronics device integration.

Keywords:
electrochemical etching /

electroluminescence /

narrowed emission /

Sibased organic microcavity
Authors and contacts
Xiong Zu-Hong²,

Shi Hua-Zhong²,

Fan Yong-Liang²,

Zhang Song-Tao²,

Zhan Yi-Qiang²,

He Jun²,

Zhong Gao-Yu²,

Xu Shao-Hui²,

Liu Yi²,

Wang Xiao-Jun²,

Wang Zi-Jun²,

Ding Xun-Min²,

Huang Wei¹,

Hou XiaoYuan³

(1)复旦大学先进材料与技术研究院和高分子科学系，上海 200433; (2)复旦大学应用表面物理国家重点实验室，上海 200433; (3)复旦大学应用表面物理国家重点实验室和先进材料与技术研究院，上海 200433
References

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Vol. 52, Issue 5 - 2003-03-05

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