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Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica,
2023, 72(1): 017101.
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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng. Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica,
2018, 67(2): 027301.
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Xu Si-Wei, Wang Li, Shen Xiang. Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica,
2015, 64(22): 223302.
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Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei. X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica,
2010, 59(7): 4584-4590.
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2007, 56(6): 3468-3472.
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Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan. Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica,
2005, 54(11): 5372-5376.
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2004, 53(3): 915-921.
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2001, 50(12): 2429-2433.
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1996, 45(7): 1244-1248.
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SU FANG, XIE BIN, SHEN BAO-GEN. PRESSURE-COEFFICIENT OF RESISTIVITY AND RELAXATION UNDER PRESSURE IN AMORPHOUS ALLOYS (Fe1-xCox)77.5Nd4B18.5. Acta Physica Sinica,
1994, 43(8): 1301-1310.
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1992, 41(4): 655-660.
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1992, 41(11): 1849-1855.
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1991, 40(2): 275-280.
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1989, 38(4): 675-678.
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1989, 38(6): 987-990.
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1989, 38(4): 689-693.
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1984, 33(10): 1359-1367.
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