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物理学报. 2006, 55(1): 68-75.
doi: 10.7498/aps.55.68.
X射线二极管时间特性研究
- 收稿日期: 2005-02-04
- 修回日期: 2005-05-16
- 刊出日期: 2006-01-20
English Abstract
Research on time characteristics of soft X-ray diode
- Received Date:
04 February 2005
- Accepted Date:
16 May 2005
- Published Online:
20 January 2006
Abstract: In this paper the time characteristics of soft X-ray diode (XRD) is studied. XRD is the importance component of soft X-ray spectrometer,which measures the soft X-ray spectrum emited by laser-plasma.The experiment utilizes the 200TW laser facility with energy ～6J and pulse width ～30fs at the Laser Fusion Research Center of CAEP.The Au foil target irradiated by laser pulse produced X-ray emission, the filter(Al)-XRD system measures the X-ray signal.The high frequency cable (SUJ-50) transmits the electrical signal, a broad band oscillograph (TDS694C and TDS6604B) registers the signal.Linearity fit and comparison analysis of experimental data are performed.
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