-
[1] Crivello R, Grow R W 1988 IEEE Trans. on ED 35 1701
[2] Gerum W, Bruck M, Fischer G, Henry D, Rothacker H P 2005 IEEE Trans. on ED 52 669
[3] Chong C K, Davis J A, Le Borgne R H, Ramay M L, Stolz R J, Tamashiro R N, Vaszari J P, Zhai Z L 2005 IEEE Trans. on ED 52 653
[4] Ghosh T K, Challis A J, Jacob A, Bowler D, Carter R G 2008 IEEE Trans. on ED 55 668
[5] Han Y, Liu Y W, Ding Y G, Liu P K 2009 Acta Phys. Sin. 58 1806 (in Chinese) [韩勇, 刘燕文, 丁耀根, 刘濮鲲 2009 物理学报 58 1806]
[6] Zhao X Q, Zhang G X, Sun X H, Ding D, Xie K 2004 Acta Electronica Sinica 32 1029 (in Chinese) [赵新群, 张国兴, 孙小菡, 丁东, 谢锴 2004 电子学报 32 1029]
[7] Han Y, Liu Y W, Ding Y G, Liu P K 2007 IEEE Trans. on ED 54 1562
[8] Culshaw B, Kersey A 2008 IEEE J. Lightwave Technol. 26 1064
[9] Qiao X G, Jia Z A, Fu H W, Li M, Zhou H 2004 Acta Phys. Sin. 53 494 (in Chinese) [桥学光, 贾振安, 傅海威, 李明, 周红 2004 物理学报 53 494]
[10] Kunkel S H, Peck M W 1994 InterSociety Conference on Thermal Phenomena Washington DC, USA, May 4-7, 1994, 91
[11] Felli F, Brotzu A, Caponero M A, Paolozzi A 2008 IEEE Sensors Journal 8 1299
-
[1] Crivello R, Grow R W 1988 IEEE Trans. on ED 35 1701
[2] Gerum W, Bruck M, Fischer G, Henry D, Rothacker H P 2005 IEEE Trans. on ED 52 669
[3] Chong C K, Davis J A, Le Borgne R H, Ramay M L, Stolz R J, Tamashiro R N, Vaszari J P, Zhai Z L 2005 IEEE Trans. on ED 52 653
[4] Ghosh T K, Challis A J, Jacob A, Bowler D, Carter R G 2008 IEEE Trans. on ED 55 668
[5] Han Y, Liu Y W, Ding Y G, Liu P K 2009 Acta Phys. Sin. 58 1806 (in Chinese) [韩勇, 刘燕文, 丁耀根, 刘濮鲲 2009 物理学报 58 1806]
[6] Zhao X Q, Zhang G X, Sun X H, Ding D, Xie K 2004 Acta Electronica Sinica 32 1029 (in Chinese) [赵新群, 张国兴, 孙小菡, 丁东, 谢锴 2004 电子学报 32 1029]
[7] Han Y, Liu Y W, Ding Y G, Liu P K 2007 IEEE Trans. on ED 54 1562
[8] Culshaw B, Kersey A 2008 IEEE J. Lightwave Technol. 26 1064
[9] Qiao X G, Jia Z A, Fu H W, Li M, Zhou H 2004 Acta Phys. Sin. 53 494 (in Chinese) [桥学光, 贾振安, 傅海威, 李明, 周红 2004 物理学报 53 494]
[10] Kunkel S H, Peck M W 1994 InterSociety Conference on Thermal Phenomena Washington DC, USA, May 4-7, 1994, 91
[11] Felli F, Brotzu A, Caponero M A, Paolozzi A 2008 IEEE Sensors Journal 8 1299
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