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Xu Xiao-Ming, Miao Wei, Tao Kun. Study on the effect of X-ray diffractometer inherent angle scale error on the precision of lattice parameter calculation. Acta Physica Sinica,
2014, 63(13): 136001.
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Liu Hai-Gang, Xu Zi-Jian, Zhang Xiang-Zhi, Guo Zhi, Tai Ren-Zhong. Influence of central beamstop on ptychographic coherent diffractive imaging. Acta Physica Sinica,
2013, 62(15): 150702.
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Pan Zhi-Yun, Sun Zhi-Hu, Xie Zhi, Yan Wen-Sheng, Wei Shi-Qiang. Local structures of Si/Gen/Si(001) hetero-structure films studied by grazing incidence fluorescence X-ray absorption fine structure. Acta Physica Sinica,
2007, 56(6): 3344-3349.
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2004, 53(10): 3510-3514.
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2001, 50(7): 1318-1323.
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1990, 39(1): 124-128.
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