Electromagnetic performances of multilayer plane delamination media with an ITO (indium tin oxide) transparent conductive film have been researched theoretically and the calculated curve well agrees with the measured curve.The research shows that the electromagnetic performances of the multilayer media are related to ITO (with sheet resistance 8Ω) film's interface location,the layer number of the plane delamination media and the thickness of the plane delamination media,and so on.An optimized system of four-layer plane delamination mediums with a thickness of only 7.35mm and very large electromagnetic reflectance within the rauge of 8—18GHz has been designed.The sheet resistance of the ITO film in the multilayer plane delamination media should be less than 30Ω,and the smaller the sheet resistance,the langer the electromagnetic reflectance of the multilayer plane delamination media.
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