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The evolution of filaments structure with the applied voltage and gas pressure in dielectric barrier discharge in argon/air mixture is studied, which is also analyzed in the aspect of two-dimensional phase transition. With the increase of the applied voltage, the filaments structure undergoes stages of sparse random filaments-dense random filaments-hexagon structure-hexagonal superlattice structure-chaos, which can be considered as a phase transition from gas-liquid-simple solid-superlattice solid-liquid. The changes of the lattice constant and the distance between two neighboring lattice points are investigated in the process of formation of the hexagonal superlattice structure in the phase transition. In addition, the formation of the large spots and the Penta-Hepta defects in the hexagonal superlattice structure are also studied.
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Keywords:
- dielectric barrier discharge /
- filaments structure /
- phase transition /
- superlattice
[1] [1]Kogelschatz U 2002 IEEE Trans. on Plasma Sci. 30 1400
[2] [2]Xu X 2001 Thin solid Films 390 237
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[10] ]Dong L F, Gao R L, He Y F, Fan W L, Li X C, Liu S H, Liu W L 2007 Acta Phys. Sin. 56 1471 (in Chinese).[董丽芳、高瑞玲、贺亚峰、范伟丽、李雪辰、刘书华、刘微粒 2007 物理学报 56 1471]
[11] ] Dong L F, He Y F, Liu W L, Gao R L, Wang H F, Zhao H T 2007 Appl. Phys. Lett. 90 031504
[12] ] Zanin A L, Gurevich E L, Moskalenko A S, Bdeker H U, Purwins H G 2004 Phys. Rev. E 70 036202
[13] ]Breazeal W, Flynn K M, Gwinn E G 1995 Phys. Rev. E 52 1503
[14] ]Shirafuji T, Kitagawa T, Wakai T, Tachibana K 2003 Appl. Phys. Lett 83 2309
[15] ] Stollenwerk L, Laven J G, Purwins H G 2007 Phys. Rev. Lett. 98 255001
[16] ] Brauer I, Bode M, Ammelt E, Purwins H G 2000 Phys. Rev. Lett. 84 4104
[17] ] Quinn R A, Goree J 2002 Phys. Rev. Lett. 88 195001
[18] ] Chi J H, Lin I 1994 Phys. Rev. Lett. 72 4009
[19] ] Carpio A, Bonilla L L 2008 Phys. Rev. B 78 085406
[20] ] Dong L F, Gao R L, He Y F, Fan W L, Liu W L 2006 Phys. Rev. E 74 057202
[21] ]López\|Sancho M P, de Juan F, Vozmediano M A H 2009 Phys. Rev. B 79 075413
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[1] [1]Kogelschatz U 2002 IEEE Trans. on Plasma Sci. 30 1400
[2] [2]Xu X 2001 Thin solid Films 390 237
[3] [3]Li G, Xu Y J, Mu K J, Nie C Q, Zhu J Q, Zhang Y, Li H M 2008 Acta Phys. Sin. 57 6444 (in Chinese)[李钢、徐燕骥、穆克进、聂超群、朱俊强、张翼、李汉明 2008 物理学报 57 6444]
[4] [4]Yin Z Q, Wan J Y, Huang M Q, Wang H J 2007 Acta Phys. Sin. 56 7078 (in Chinese)[尹增谦、万景瑜、黄明强、王慧娟 2007 物理学报 56 7078]
[5] [5]Ouyang J T, He F, Mao J S, Feng S 2006 Acta Phys. Sin. 55 5969 (in Chanese)[欧阳吉庭、何锋、缪劲松、冯硕 2006 物理学报 55 5969]
[6] [6]Zhang Y T, Wang D Z, Wang Y H 2005 Acta Phys. Sin. 54 4808 (in Chinese)[张远涛、王德真、王艳辉 2005 物理学报 54 4808]
[7] [7]Wang Y H, Wang D Z, 2005 Acta Phys. Sin. 54 1295 (in Chinese)[王艳辉、王德真 2005 物理学报 54 1295]
[8] [8]Zhang H Y, Wang D Z, Wang X G 2007 Chin. Phys. 16 1089
[9] [9]Shang W L, Wang D Z, Kong M G 2007 Chin. Phys. 16 458
[10] ]Dong L F, Gao R L, He Y F, Fan W L, Li X C, Liu S H, Liu W L 2007 Acta Phys. Sin. 56 1471 (in Chinese).[董丽芳、高瑞玲、贺亚峰、范伟丽、李雪辰、刘书华、刘微粒 2007 物理学报 56 1471]
[11] ] Dong L F, He Y F, Liu W L, Gao R L, Wang H F, Zhao H T 2007 Appl. Phys. Lett. 90 031504
[12] ] Zanin A L, Gurevich E L, Moskalenko A S, Bdeker H U, Purwins H G 2004 Phys. Rev. E 70 036202
[13] ]Breazeal W, Flynn K M, Gwinn E G 1995 Phys. Rev. E 52 1503
[14] ]Shirafuji T, Kitagawa T, Wakai T, Tachibana K 2003 Appl. Phys. Lett 83 2309
[15] ] Stollenwerk L, Laven J G, Purwins H G 2007 Phys. Rev. Lett. 98 255001
[16] ] Brauer I, Bode M, Ammelt E, Purwins H G 2000 Phys. Rev. Lett. 84 4104
[17] ] Quinn R A, Goree J 2002 Phys. Rev. Lett. 88 195001
[18] ] Chi J H, Lin I 1994 Phys. Rev. Lett. 72 4009
[19] ] Carpio A, Bonilla L L 2008 Phys. Rev. B 78 085406
[20] ] Dong L F, Gao R L, He Y F, Fan W L, Liu W L 2006 Phys. Rev. E 74 057202
[21] ]López\|Sancho M P, de Juan F, Vozmediano M A H 2009 Phys. Rev. B 79 075413
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