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Using the closed orbit theory, we study the photo-detachment of H- in a magnetic field near a dielectric surface. The photo-detachment cross section of this system is also derived and calculated. It is found that the photo-detachment cross section is not only related to the magnetic field strength, but also depends on the dielectric constant. For a given ion-surface distance and dielectric constant, with the increase of the magnetic field strength, the number of the closed orbits increases greatly and the oscillatory structure in the photo-detachment cross section becomes much more complicated. On the other hand, for a given magnetic field strength, the dielectric constant also has a great influence on the photo-detachment process of negative ion. Above the ionization threshold, the photo-detachment cross section becomes oscillatory. With the increase of the dielectric constant, the oscillatory structure in the cross-section becomes much more complicated. Therefore we can control the photo-detachment of negative ion by changing the magnetic field strength and the dielectric constant. This study provides a new understanding of the photo-detachment process of negative ion in the presence of external fields and surfaces.
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Keywords:
- photodetachment /
- closed orbit theory /
- dielectric surface /
- magnetic field
[1] Blumberg W A M, Itano W M, Larson D J 1979 Phys. Rev. A 19 139
[2] Bryant H C, Mohagheghi A, Stewart J E, Donahue J B, Quick C R, Reeder R A, Yuan V, Hummer C R, Smith W W, Stanley C, William P R, Lillian O 1987 Phys. Rev. Lett. 58 2412
[3] Du M L, Delos J B 1988 Phys. Rev. A 38 1896
[4] Song X H, Lin S L 2003 Acta Phys. Sin. 52 1611 (in Chinese) [宋晓红, 林圣路 2003 物理学报 52 1611]
[5] Peters A D, Jaffe C, Delos J B 1997 Phys. Rev. A 56 331
[6] Peters A D, Delos J B 1993 Phys. Rev. A 47 3020
[7] Liu Z Y, Wang D H 1997 Phys. Rev. A 55 4605
[8] Liu Z Y, Wang D H 1997 Phys. Rev. A 56 2670
[9] Petek H, Weida M J, Nagano H, Ogawa S 2000 Science 288 1402
[10] Sjakste J, Borisov A G, Gauyacq J P 2004 Phys. Rev. Lett. 92 156101
[11] Yang G C, Zheng Y Z, Chi X X 2006 J. Phys. B 39 1855
[12] Yang G C, Zheng Y Z, Chi X X 2006 Phys. Rev. A 73 043413
[13] Wang D H 2007 Eur. Phys. J. D 45 179
[14] Wang D H, Yu Y J 2008 Chin. Phys. B 17 1231
[15] Zhao H J, Du M L 2009 Phys. Rev. A 79 023408
[16] Rui K K, Yang G C 2009 Surf. Sci. 603 632
[17] Wang D H, Huang K Y 2010 Commun. Theor. Phys. 53 898
[18] Yang G C, Du M L 2010 J. Phys. B: At. Mol. Opt. Phys. 43 035002
[19] Huang K Y, Wang D H 2010 Acta Phys. Sin. 59 932 (in Chinese) [黄凯云, 王德华 2010 物理学报 59 932]
[20] Wang D H, Tang T T,Wang S S 2010 J. Electron Spectrosc. Relat. Phenom. 177 30
[21] Du M L 1989 Phys. Rev. A 40 4984 063202-7
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[1] Blumberg W A M, Itano W M, Larson D J 1979 Phys. Rev. A 19 139
[2] Bryant H C, Mohagheghi A, Stewart J E, Donahue J B, Quick C R, Reeder R A, Yuan V, Hummer C R, Smith W W, Stanley C, William P R, Lillian O 1987 Phys. Rev. Lett. 58 2412
[3] Du M L, Delos J B 1988 Phys. Rev. A 38 1896
[4] Song X H, Lin S L 2003 Acta Phys. Sin. 52 1611 (in Chinese) [宋晓红, 林圣路 2003 物理学报 52 1611]
[5] Peters A D, Jaffe C, Delos J B 1997 Phys. Rev. A 56 331
[6] Peters A D, Delos J B 1993 Phys. Rev. A 47 3020
[7] Liu Z Y, Wang D H 1997 Phys. Rev. A 55 4605
[8] Liu Z Y, Wang D H 1997 Phys. Rev. A 56 2670
[9] Petek H, Weida M J, Nagano H, Ogawa S 2000 Science 288 1402
[10] Sjakste J, Borisov A G, Gauyacq J P 2004 Phys. Rev. Lett. 92 156101
[11] Yang G C, Zheng Y Z, Chi X X 2006 J. Phys. B 39 1855
[12] Yang G C, Zheng Y Z, Chi X X 2006 Phys. Rev. A 73 043413
[13] Wang D H 2007 Eur. Phys. J. D 45 179
[14] Wang D H, Yu Y J 2008 Chin. Phys. B 17 1231
[15] Zhao H J, Du M L 2009 Phys. Rev. A 79 023408
[16] Rui K K, Yang G C 2009 Surf. Sci. 603 632
[17] Wang D H, Huang K Y 2010 Commun. Theor. Phys. 53 898
[18] Yang G C, Du M L 2010 J. Phys. B: At. Mol. Opt. Phys. 43 035002
[19] Huang K Y, Wang D H 2010 Acta Phys. Sin. 59 932 (in Chinese) [黄凯云, 王德华 2010 物理学报 59 932]
[20] Wang D H, Tang T T,Wang S S 2010 J. Electron Spectrosc. Relat. Phenom. 177 30
[21] Du M L 1989 Phys. Rev. A 40 4984 063202-7
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