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In this paper, we introduce a method to incorporate a planar defect into the fcc-like photonic crystal structure by utilizing a negative photoresistor SU8. This method in which multi-coating and a single exposure are used simplifies the experiment much more than other methods. In the paper, we exhibit the SEM images for the intact and defective structures. Corresponding to each structure, the reflection spectrum in (1 1 1) direction fabricated shows obviously characteristic peaks and pits. For the intact structure, the spectrum contains two peaks whose wavelengths approach to 1.2 μm and 2.2 μm. These two peaks corresponds to two optical forbidden gaps. For the structure with planar defect, a pit which splits the optical forbidden gap is considered to be a defect mode exhibited on spectral curve. The structure parameters are extracted from the SEM image and used to simulate the reflectance spectra via FDTD program. The simulation results almost match the experiment data accurately.
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Keywords:
- photonic crystal /
- multi-beam interference /
- infrared spectrum /
[1] Yablonovitch E 1987 Phys. Rev. Lett. 58 2059
[2] Chen X J, Xu Y, Sheng L, Qi G, Yang X, Wu L J 2008 Appl. Opt. 26 4701
[3] Wu L J, Malizu M, Gallet J F, Krauss T F 2005 Appl. Phys. Lett. 86 211106
[4] Xu Y, Chen X J, Lan S, Guo Q, Hu W 2008 J. Opt. A: Pure Appl. Opt. 10 085201
[5] Chen X J, Wu L J, Hu W, Lan S 2009 Acta Phys. Sin. 58 1028 (in Chinese) [陈小军, 吴立军, 胡巍, 兰胜 2009 物理学报 58 1028]
[6] Hao Q 2004 Nature 429 540
[7] Blanco A 2000 Nature 405 427
[8] Kawashima T, Miura K, Sato T, Kawakami S 2000 Appl. Phys. Lett. 77 2613
[9] Deubel M 2004 Nature Master. 3 444
[10] Campbell M 2000 Nature 404 53
[11] Noda S, Tomoda K, Yamamoto N, Chutinan A 2000 Science 289 604
[12] Deubel M, Wegener M, Linden S, Freymann G, John S 2006 Opt. Lett. 31 805
[13] Jun Y H, Leatherdale C A, Noriss D J 2005 Adv. Mater. 17 1908
[14] Scrimgeour J, Sharp D N, Blanford C F, Roche O M, Denning R G, Turberfild A J 2006 Adv. Mater. 12 1557
[15] Zhang P Q, Xie X S, Guan Y F, Zhou J Y, Wong K S, Yan L 2010 Appl. Phys. B 104 113
[16] Tetreault N, Mihi A, Migues H, Rodriguez I, Ozin G A, Meseguer F, Kitaev V 2004 Adv. Mater. 16 346
[17] Delcampo A, Greiner C 2007 J. Micromech. Microeng. 17 R81
[18] Wu L J, Zhong Y C, Chan C T, Wong K S, Wang G P 2005 Appl. Phys. Lett. 86 241102
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[1] Yablonovitch E 1987 Phys. Rev. Lett. 58 2059
[2] Chen X J, Xu Y, Sheng L, Qi G, Yang X, Wu L J 2008 Appl. Opt. 26 4701
[3] Wu L J, Malizu M, Gallet J F, Krauss T F 2005 Appl. Phys. Lett. 86 211106
[4] Xu Y, Chen X J, Lan S, Guo Q, Hu W 2008 J. Opt. A: Pure Appl. Opt. 10 085201
[5] Chen X J, Wu L J, Hu W, Lan S 2009 Acta Phys. Sin. 58 1028 (in Chinese) [陈小军, 吴立军, 胡巍, 兰胜 2009 物理学报 58 1028]
[6] Hao Q 2004 Nature 429 540
[7] Blanco A 2000 Nature 405 427
[8] Kawashima T, Miura K, Sato T, Kawakami S 2000 Appl. Phys. Lett. 77 2613
[9] Deubel M 2004 Nature Master. 3 444
[10] Campbell M 2000 Nature 404 53
[11] Noda S, Tomoda K, Yamamoto N, Chutinan A 2000 Science 289 604
[12] Deubel M, Wegener M, Linden S, Freymann G, John S 2006 Opt. Lett. 31 805
[13] Jun Y H, Leatherdale C A, Noriss D J 2005 Adv. Mater. 17 1908
[14] Scrimgeour J, Sharp D N, Blanford C F, Roche O M, Denning R G, Turberfild A J 2006 Adv. Mater. 12 1557
[15] Zhang P Q, Xie X S, Guan Y F, Zhou J Y, Wong K S, Yan L 2010 Appl. Phys. B 104 113
[16] Tetreault N, Mihi A, Migues H, Rodriguez I, Ozin G A, Meseguer F, Kitaev V 2004 Adv. Mater. 16 346
[17] Delcampo A, Greiner C 2007 J. Micromech. Microeng. 17 R81
[18] Wu L J, Zhong Y C, Chan C T, Wong K S, Wang G P 2005 Appl. Phys. Lett. 86 241102
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