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Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua. Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unitJ. Acta Physica Sinica, 2024, 73(6): 066103. DOI: 10.7498/aps.73.20231564
Citation: Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua. Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unitJ. Acta Physica Sinica, 2024, 73(6): 066103. DOI: 10.7498/aps.73.20231564
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Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit

Acta Phys. Sin., 2024, 73(6): 066103.
DOI: 10.7498/aps.73.20231564
CSTR: 32037.14.aps.73.20231564
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    Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit[Acta Phys. Sin. 2024, 73(6): 066103] 

    Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua. Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit [Acta Phys. Sin. 2024, 73(7): 079901]. Acta Phys. Sin., 2024, 73(7): 079901. doi: 10.7498/aps.73.079901

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