基于双音外差的电光相位调制器半波电压自校准测量方法

王恒; 张尚剑; 邹新海; 刘俊伟; 张雅丽; 李和平; 刘永

doi:10.7498/aps.64.124211

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基于双音外差的电光相位调制器半波电压自校准测量方法

王恒 , 张尚剑 , 邹新海 , 刘俊伟 , 张雅丽 , 李和平 , 刘永

基于双音外差的电光相位调制器半波电压自校准测量方法

王恒, 张尚剑, 邹新海, 刘俊伟, 张雅丽, 李和平, 刘永

物理学报. 2015, 64(12): 124211.

doi: 10.7498/aps.64.124211.

摘要

电光相位调制器是光纤通信系统、微波光子系统和相干光通信系统中的关键器件之一. 作为器件本征参数, 电光相位调制器的半波电压通常利用光谱方法和电谱方法进行测量. 光谱方法受到光源线宽和光谱仪分辨率限制, 测量的分辨率较低; 电谱方法则需要光电检测之前将相位调制转换成强度调制, 电谱方法的主要困难在于需要对探测器的不平坦响应进行额外校准. 提出了利用双音外差实现电光相位调制器半波电压自校准测量新方法, 该方法利用双音电光相位调制的边带与移频光载波的外差拍频, 对外差拍频信号进行频谱分析, 获得电光相位调制器的半波电压; 通过设定双音调制信号的频率关系, 克服了探测器光电转换中的不平坦频率响应, 实现了自校准测量. 该方法可扩展探测器和频谱仪的测试频率两倍以上, 节省至少一半的带宽需求. 与光谱测量方法相比, 该方法测试分辨率大幅提高且避免了光源线宽的影响; 与传统电域测量方法相比, 该方法无须额外校准, 无驱动功率和工作波长限制, 且对测试仪器带宽需求降低一半以上. 实验证实了所提方法获得的电光相位调制器半波电压的测量结果与光谱分析法获得的结果一致, 且大幅度地提高了测量范围和分辨率. 该方法提供了非常简单的电光相位调制器微波特性化分析方法, 对其他光电子器件分析也提供了参考.

关键词:

作者及机构信息

1.
电子科技大学光电信息学院, 电子薄膜与集成器件国家重点实验室, 成都 610054

基金项目: 国家重点基础研究发展计划(批准号:2011CB301705,2012CB315702)、国家自然科学基金(批准号:61377037,61421002,61378028)、四川省青年基金(批准号:2013JQ0026)、教育部新世纪人才支持计划(批准号:NCET-11-0069)和信息光子学与光通信国家重点实验室(北京邮电大学)开放基金资助的课题.

参考文献

[1]	Yao J P 2009 J. Lightwave Technol. 27 314
[2]	Li W, Wang L X, Zheng J Y, Li M, Zhu N H 2013 IEEE Photon. Technol. Lett. 25 1875
[3]	Pagán V R, Haas B M, Murphy T E 2011 Opt. Express 19 883
[4]	Liao Y, Zhou H J, Meng Z 2009 Opt. Lett. 34 1822
[5]	Shi Y Q, Yan L S, Willner A E 2003 J. Lightwave Technol. 21 2358
[6]	Oikawa S, Kawanishi T, Izutsu M 2003 IEEE Photon. Technol. Lett. 15 682
[7]	Huo W J, Xie H Y, Liang S, Zhang W R, Jiang Z Y, Chen X, Lu D 2013 Acta Phys. Sin. 62 228501 (in Chinese) [霍文娟, 谢红云, 梁松, 张万荣, 江之韵, 陈翔, 鲁东 2013 物理学报 62 228501]
[8]	Chan E H W, Minasian R A 2008 J. Lightwave Technol. 26 2882
[9]	Hauden J, Porte H 2013 Acta Phys. Sin. 62 184206 (in Chinese) [杜军, 赵卫疆, 曲彦臣, 陈振雷, 耿利杰 2013 物理学报 62 184206]
[10]	Chtcherbakov A A, Kisch R J, Bull J D, Jaeger N A F 2007 IEEE Photon. Technol. Lett. 19 18
[11]	Chi H, Zou X H, Yao J P 2009 J. Lightwave Technol. 27 511
[12]	Zhang S J, Zhang X X, Liu Y 2012 Chin. Phys. Lett. 29 084217
[13]	Zhang S J, Zhang X X, Liu S Liu Y 2012 Opt. Commun. 285 5089
[14]	Zhang S J, Wang H, Zou X H, Zhang Y L, Lu R G, Liu Y 2014 Opt. Lett. 39 3504
[15]	Zhang S J, Wang H, Zou X H, Zhang Y L, Lu R G, Liu Y 2014 IEEE Photon. Technol. Lett. 26 29
[16]	Yu Y, Xu E M, Dong J J, Zhou L N, Li X, Zhang X L 2010 Opt. Express 18 25271

施引文献

[1]	Yao J P 2009 J. Lightwave Technol. 27 314
[2]	Li W, Wang L X, Zheng J Y, Li M, Zhu N H 2013 IEEE Photon. Technol. Lett. 25 1875
[3]	Pagán V R, Haas B M, Murphy T E 2011 Opt. Express 19 883
[4]	Liao Y, Zhou H J, Meng Z 2009 Opt. Lett. 34 1822
[5]	Shi Y Q, Yan L S, Willner A E 2003 J. Lightwave Technol. 21 2358
[6]	Oikawa S, Kawanishi T, Izutsu M 2003 IEEE Photon. Technol. Lett. 15 682
[7]	Huo W J, Xie H Y, Liang S, Zhang W R, Jiang Z Y, Chen X, Lu D 2013 Acta Phys. Sin. 62 228501 (in Chinese) [霍文娟, 谢红云, 梁松, 张万荣, 江之韵, 陈翔, 鲁东 2013 物理学报 62 228501]
[8]	Chan E H W, Minasian R A 2008 J. Lightwave Technol. 26 2882
[9]	Hauden J, Porte H 2013 Acta Phys. Sin. 62 184206 (in Chinese) [杜军, 赵卫疆, 曲彦臣, 陈振雷, 耿利杰 2013 物理学报 62 184206]
[10]	Chtcherbakov A A, Kisch R J, Bull J D, Jaeger N A F 2007 IEEE Photon. Technol. Lett. 19 18
[11]	Chi H, Zou X H, Yao J P 2009 J. Lightwave Technol. 27 511
[12]	Zhang S J, Zhang X X, Liu Y 2012 Chin. Phys. Lett. 29 084217
[13]	Zhang S J, Zhang X X, Liu S Liu Y 2012 Opt. Commun. 285 5089
[14]	Zhang S J, Wang H, Zou X H, Zhang Y L, Lu R G, Liu Y 2014 Opt. Lett. 39 3504
[15]	Zhang S J, Wang H, Zou X H, Zhang Y L, Lu R G, Liu Y 2014 IEEE Photon. Technol. Lett. 26 29
[16]	Yu Y, Xu E M, Dong J J, Zhou L N, Li X, Zhang X L 2010 Opt. Express 18 25271

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物理学报. 2015, 64(12): 124211.

doi: 10.7498/aps.64.124211.

基于双音外差的电光相位调制器半波电压自校准测量方法

1. 电子科技大学光电信息学院, 电子薄膜与集成器件国家重点实验室, 成都 610054

基金项目:

国家重点基础研究发展计划(批准号:2011CB301705,2012CB315702)、国家自然科学基金(批准号:61377037,61421002,61378028)、四川省青年基金(批准号:2013JQ0026)、教育部新世纪人才支持计划(批准号:NCET-11-0069)和信息光子学与光通信国家重点实验室(北京邮电大学)开放基金资助的课题.

收稿日期: 2014-10-21
修回日期: 2014-12-18
刊出日期: 2015-06-05

摘要: 电光相位调制器是光纤通信系统、微波光子系统和相干光通信系统中的关键器件之一. 作为器件本征参数, 电光相位调制器的半波电压通常利用光谱方法和电谱方法进行测量. 光谱方法受到光源线宽和光谱仪分辨率限制, 测量的分辨率较低; 电谱方法则需要光电检测之前将相位调制转换成强度调制, 电谱方法的主要困难在于需要对探测器的不平坦响应进行额外校准. 提出了利用双音外差实现电光相位调制器半波电压自校准测量新方法, 该方法利用双音电光相位调制的边带与移频光载波的外差拍频, 对外差拍频信号进行频谱分析, 获得电光相位调制器的半波电压; 通过设定双音调制信号的频率关系, 克服了探测器光电转换中的不平坦频率响应, 实现了自校准测量. 该方法可扩展探测器和频谱仪的测试频率两倍以上, 节省至少一半的带宽需求. 与光谱测量方法相比, 该方法测试分辨率大幅提高且避免了光源线宽的影响; 与传统电域测量方法相比, 该方法无须额外校准, 无驱动功率和工作波长限制, 且对测试仪器带宽需求降低一半以上. 实验证实了所提方法获得的电光相位调制器半波电压的测量结果与光谱分析法获得的结果一致, 且大幅度地提高了测量范围和分辨率. 该方法提供了非常简单的电光相位调制器微波特性化分析方法, 对其他光电子器件分析也提供了参考.

关键词:

English Abstract

Two-tone optical heterodyning method for the self-calibrated measurement of half-wave voltage of electrooptic phase modulator

1.
State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China

Fund Project:
Project supported by the National Basic Research Program of China (Grant Nos. 2011CB301705, 2012CB315702), the National Natural Science Foundation of China (Grant Nos. 61377037, 61421002, 61378028), the Science Foundation for Youths of Sichuan Province, China (Grant No. 2013JQ0026), the Program for New Century Excellent Talents in University of Ministry of Education of China (Grant No. NCET-11-0069), and the Open Fund of State Key Laboratory of Information Photonics and Optical Communications (Beijing University of Posts and Telecommunications), China.

Received Date: 21 October 2014
Accepted Date: 18 December 2014
Published Online: 05 June 2015

Abstract: High speed electrooptic phase modulators play very important roles in the high-speed optical fiber communication system, microwave photonic system, and coherent optical communication system, due to their advantages of bias voltage free and linear modulation. As an intrinsic parameter, the half-wave voltage of an electrooptic phase modulator has been characterized by using an electrical spectrum method and an optical spectrum method in the last two decades. The optical spectrum method is generally limited by the line-width of the laser source and the resolution of the available optical spectrum analyzer, while the electrical spectrum method requires the conversion from phase modulation to intensity modulation before photodetection, since a phase modulator generates a phase modulated optical signal with constant envelope. The major difficulty in the electrical spectrum method lies in the extra calibration for the responsivity fluctuation in the photodetection. In this paper, a novel self-calibrated measurement of half-wave voltage of electrooptic phase modulators is carried out based on the optical heterodyning between the two-tone phase modulated sidebands and the frequency-shifted carrier. The method achieves a self-calibration measurement, and avoids the effect of the responsivity fluctuation in the photodetection by setting a specific frequency relationship between the two-tone microwave signals. Moreover, it extends the measuring frequency range to the double bandwidth of photodetection and spectrum analysis. Compared with the optical spectrum method, the proposed method achieves very high frequency resolution measurement, and simultaneously avoids the line-width influence of laser source by use of two-tone heterodyning. Compared with the traditional electrical spectrum method, our method works under no small-signal assumption nor photodetection calibration, and eliminates the limits of electrical driving amplitude and operating wavelength. Moreover, it decreases by at least half bandwidth requirement for the photodetector and spectrum analyzer. Our experimental demonstration shows that the measured half-wave voltages of the electrooptic phase modulator obtained by our method agree well with the data measured by the optical spectrum method, and the two-tone heterodyning method greatly improves the measurement range and frequency resolution. The proposed measurement method provides a very simple analysis method for the microwave characterization of high-speed electrooptic phase modulators, which is also a reference for other optoelectronic devices.

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