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为了提高行波管的稳定性和可靠性,电子注的优化与设计成为真空电子器件中的关键部分,层流性是评价电子注质量的关键参数。提出使用K均值聚类算法将电子枪注腰处粒子简化为宏粒子的方法。将该宏粒子作为行波管互作用区的粒子源进行注波互作用仿真,使得仿真时间由5.53h减少为0.65h,提高了仿真效率。通过对某型号行波管的电子枪进行阴极发散角度和阴阳极间距离的调整。仿真结果表明,发散角度在0~1°范围调节时,发散角度越大,径向均方根发射度数值也越大,电子注层流性就越差,行波管输出功率下降;阴阳极间距离在0.8~1.6mm范围内调节时,径向均方根发射度由2.51 mm·mrad下降为2.22 mm·mrad时,电子注的层流性得到改善,空间行波管输出功率由328.34 W上升为414.10 W。因此,采用K均值聚类算法的粒子简化模型,提升了注波互作用仿真效率,依据电子注层流性对行波管性能的影响可以对电子枪结构参数优化。In order to improve the stability and reliability of the traveling wave tube (TWT), the optimization and design of the electron beam have become a key part in vacuum electronic devices. Laminar properties are a key parameter for evaluating the quality of the electron beam. The transverse displacement of the particles in the laminar electron beam is proportional to the transverse velocity. In the phase space distribution image of nonlaminar properties electrons at a certain position, there is no linear relationship between the transverse displacement and the transverse velocity. Since the energies of each particle in the electron beam are different, this leads to different initial velocities of each particle. The particle source at the electron beam waist in the electron gun is adopted as the particle source for the beam wave interaction simulation. The output characteristics of the TWT are closer to the actual situation. A method of simplifying the particles at the electron gun beam waist into macroparticles using the K-means clustering algorithm is proposed. The macroparticle was used as the particle source in the TWT interaction zone for the simulation of the beam wave interaction, which reduced the simulation time from 5.53h to 0.65h and improved the simulation efficiency. Compared with the original particle, both the K-means clustering algorithm simplifying the original particle and the mesh model simplifying the original particle greatly reduced the computational load of the interaction zone simulation. Compared with the grid model, The simulation results of the beam-wave interaction of macroparticles obtained by using the K-means clustering algorithm are closer to those of the beam-wave interaction using the original particles. By adjusting the cathode divergence angle and the distance between the anode and cathode of the electron gun of a certain type of TWT, the simulation results show that when the divergence angle is adjusted within the range of 0-1°, the larger the divergence angle, the larger the radial root mean square emittance value, the worse the laminar properties of the electron beam, and the power of the output signal of the TWT decreases. When the distance between the anode and cathode is adjusted within the range of 0.8-1.6mm, the simulation results show that when the parameter used to characterize the laminar properties property of the electron beam, namely the radial root mean square emittance, decreases from 2.51 mm·mrad to 2.22 mm·mrad, the laminar properties of the electron beam has been improved. The output power of the TWT has increased from 328.34 W to 414.10 W, and the operating frequency bandwidth with an output power greater than 300 W has been expanded from 3 GHz to 5 GHz. Therefore, the particle simplification model using the K-means clustering algorithm improves the simulation efficiency of the beam wave interaction. Based on the influence of the laminar properties of the electron beam on the performance of the TWT, the structural parameters of the electron gun can be optimized.
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Keywords:
- Traveling wave tube /
- electron beam laminar property /
- K-means clustering /
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[1] Guo Z, Zhang R, Lai H, Lan F, Wang Z, Lu Z 2023 IEEE Trans. Electron Dev. 702753
[2] Feng X, Liao G, Chen H, Luo C, 2024 Proceedings of the 22nd Academic Conference on Vacuum Electronics p2(in Chinese) [冯西贤,缪国兴,成红霞,罗川川,2024第二十二届真空电子学学术年会论文集p2]
[3] Pan R, Zhong C, Qian J 2024 IEEE Trans. Industrial Inf. 205914
[4] Hou J, Zhang A 2020 IEEE Trans. Industrial Inf. 162477
[5] Fang X, Xu Z, Ji H, Wang B, Huang Z 2023 IEEE Trans. Industrial Inf. 195476
[6] Jiang Z, Lin R, Yang F, Wu B 2018 IEEE Trans. Industrial Inf. 141856
[7] Jain A K 2010 Pattern Recognit. Lett. 31651
[8] Wang J, Shen C, Zhang J, Fan H, Bai N, Sun X 2023 International Vacuum Electronics Conference Chengdu, China, April 25-28, 2023 p1
[9] Carlsten B E, Nichols K E, Shchegolkov D Y, Simakov E I 2016 IEEE Trans. Electron Dev. 634493
[10] Ge X, Xu J, Yue L, Yin H, Zhao G, Wang W 2020 International Vacuum Electronics Conference Monterey, CA, USA, October 19-22, 2020 p237
[11] Shen C, Bai N, Zhang J, Sun X, Fan H 2019 International Vacuum Electronics Conference Busan, Korea (South), April 28-May 01, 2019 p1
[12] Louksha O, Trofimov P, Malkin A 2023 International Vacuum Electronics Conference Chengdu, China, April 25-28, 2023 p1
[13] Zhang J, Geng Z, Jin Q 2022 J. Phys.: Conf. Ser. 2290012030
[14] David J, Ives R L, Tran H T, Bui T, Read M E 2008 IEEE Trans. Plasma Sci. 36156
[15] Liu W, Liu S 2011 Frontiers of Electrical & Electronic Engineering in China 6556
[16] Shen C, Wang J, Zhang J, Feng J, Sun X 2022 IEEE Trans. Plasma Sci. 502830
[17] Lund S M, Kikuchi T, Davidson R C 2007 Physical Review Special Topics - Accelerators and Beams 12281
[18] Zhao G, Yue L, Wang W, Gong Y, Wei Y, Huang M 2008 High Power Laser and Particle Beams 201159(in Chinese) [赵国庆,岳玲娜,王文祥,宫玉彬,魏彦玉,黄民智2008强激光与粒子束201159]
[19] Martin P. Stockli, R. F. Welton, R. Keller 2004 Rev. Sci. Instrum 751646
[20] Whaley D R 2014 IEEE Trans. Electron Dev. 611726
[21] Li D 2024 Master's degree thesis (Chengdu: University of Electronic Science and Technology of China) (in Chinese) [李冬2024硕士学位论文(成都:电子科技大学)]
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