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常规的X射线能谱无标样定量分析采用Russ法。最近吴自勤等人又提出X射线能谱无标样定量分析的直接法。本文仍采用直接法,但吸收了Russ法中的优点。用常规的ZAF修正中使用的物理公式,推出X射线能谱另一种无标样定量分析的方法,它更便于计算。对NaCl,NaI,KCl,AgI,ZnS和GaAs样品的实验分析,证明用本文方法的分析结果优于用Russ法的分析结果。特别是对含有低原子序数元素的样品更为明显。Russ's method is usually used in the no-standards quantitative analysis of X-ray EDS. Recently Wu et al. put forward a direct no-standards quantitative analysis method. The direct no-standards quantitative analysis method is also used in this article. However we utilized the advantages of Russ's method in which the physical model in normal ZAF correction is used. The method developed by us is easy for calculation. The analytical value of the NaCl, NaI, KCl, ZnS, AgI, GaAs are better than that of Russ's method. Especially the values of the samples which contain the elements of lower atomic number are more apparent.
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