输入面纵向偏移诱导的强非局域非线性光传输特性变化

陆大全; 段秋玲; 詹强

doi:10.7498/aps.62.124205

摘要

基于模式分解方法, 分析了输入面纵向偏移诱导的强非局域非线性光传输特性变化的普适性规律. 结果表明光束输入面移动后导致的影响包括: 光斑在每个周期内出现的位置和顺序的变化、相同形状的光斑在输入面移动前后大小的差异以及波面曲率因子的演化. 这些性质可用一个简单的数学公式进行归纳; 利用这一公式可方便地由输入面移动前的任意光束解得到输入面纵向移动后的光束解.

关键词:

Based on the approach of mode decomposition, the influence of the longitudinal shift of the entrance plane on the propagation properties of beams in strongly nonlocal nonlinear medium is analyzed. The shift of the entrance plane changes the order and the longitudinal position of beam patterns in a period, the size of patterns, and the radius of the cophasal surface. These properties can be described with a simple mathematical equation, therefore the beam solution after the entrance plane is shifted can be easily obtained from that before the entrance plane is shifted.

Keywords:

作者及机构信息

1.
华南师范大学信息光电子科技学院, 广东省微纳光子功能材料与器件重点实验室, 广州 510631

基金项目: 国家自然科学基金(批准号: 10804033, 11174090, 11174091)和教育部高等学校博士点专项科研基金(批准号: 200805740002)资助的课题.

Authors and contacts

1.
Laboratory of Nanophotonic Functional Materials and Devices, School of Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510631, China

Funds: Project supported by the National Natural Science Foundation of China (Grant Nos. 10804033, 11174090, 1174091) and the Specialized Research Foundation for the Doctoral Program of Higher Education of China (Grant No. 200805740002).

参考文献

[1]	Snyder A W, Mitchell D J 1997 Science 276 1538
[2]	Lu D Q, Hu W, Zheng Y J, Liang Y B, Cao L G, Lan S, Guo Q 2008 Phys. Rev. A 78 043815
[3]	Yakimenko A I, Lashkin V M, Prikhodko O O 2006 Phys. Rev. E 73 066605
[4]	Buccoliero D, Desyatnikov A S, Krolikowski W, Kivshar Y S 2008 Opt. Lett. 33 198
[5]	Buccoliero D, Desyatnikov A S, Krolikowski W, Kivshar Y S 2007 Phys. Rev. Lett. 98 053901
[6]	Zhong W P, Lin Y 2007 Phys. Rev. A 75 061801
[7]	Peccianti M, Conti C, Assanto G, Luca A D, Umeton C 2002 Appl. Phys. Lett. 81 3335
[8]	Lopez-Aguayo S, Desyatnikov A S, Kivshar Y S 2006 Opt. Express 14 7903
[9]	Królikowski W, Bang O 2000 Phys. Rev. E 63 016610
[10]	Deng D M, Guo Q 2007 Opt. Lett. 32 3206
[11]	Mamaev A V, Zozulya A A, Mezentsev V K, Anderson D Z, Saffman M 1997 Phys. Rev. A 56 R1110
[12]	Nikolov N I, Neshev D, Królikowski W, Bang O, Rasmussen J J, Christiansen P L 2004 Opt. Lett. 29 286
[13]	Lopez-Aguayo S, Gutiérrez-Vega J C 2007 Opt. Express 15 18326
[14]	Ouyang S G, Hu W, Guo Q 2007 Phys. Rev. A 76 053832
[15]	Guo Q, Luo B, Yi F, Chi S, Xie Y 2004 Phys. Rev. E 69 016602
[16]	Guo Q, Zhang X P, Hu W, Shou Q 2006 Acta Phys. Sin. 55 1832 (in Chinese) [ 郭旗, 张霞萍, 胡巍, 寿倩 2006 物理学报 55 1832]
[17]	Bai Z Y, Deng D M, Guo Q 2012 Chin. Phys. B 21 64218
[18]	Lu D Q, Hu W, Guo Q 2009 Europhys. Lett. 86 44004

施引文献

[1]	Snyder A W, Mitchell D J 1997 Science 276 1538
[2]	Lu D Q, Hu W, Zheng Y J, Liang Y B, Cao L G, Lan S, Guo Q 2008 Phys. Rev. A 78 043815
[3]	Yakimenko A I, Lashkin V M, Prikhodko O O 2006 Phys. Rev. E 73 066605
[4]	Buccoliero D, Desyatnikov A S, Krolikowski W, Kivshar Y S 2008 Opt. Lett. 33 198
[5]	Buccoliero D, Desyatnikov A S, Krolikowski W, Kivshar Y S 2007 Phys. Rev. Lett. 98 053901
[6]	Zhong W P, Lin Y 2007 Phys. Rev. A 75 061801
[7]	Peccianti M, Conti C, Assanto G, Luca A D, Umeton C 2002 Appl. Phys. Lett. 81 3335
[8]	Lopez-Aguayo S, Desyatnikov A S, Kivshar Y S 2006 Opt. Express 14 7903
[9]	Królikowski W, Bang O 2000 Phys. Rev. E 63 016610
[10]	Deng D M, Guo Q 2007 Opt. Lett. 32 3206
[11]	Mamaev A V, Zozulya A A, Mezentsev V K, Anderson D Z, Saffman M 1997 Phys. Rev. A 56 R1110
[12]	Nikolov N I, Neshev D, Królikowski W, Bang O, Rasmussen J J, Christiansen P L 2004 Opt. Lett. 29 286
[13]	Lopez-Aguayo S, Gutiérrez-Vega J C 2007 Opt. Express 15 18326
[14]	Ouyang S G, Hu W, Guo Q 2007 Phys. Rev. A 76 053832
[15]	Guo Q, Luo B, Yi F, Chi S, Xie Y 2004 Phys. Rev. E 69 016602
[16]	Guo Q, Zhang X P, Hu W, Shou Q 2006 Acta Phys. Sin. 55 1832 (in Chinese) [ 郭旗, 张霞萍, 胡巍, 寿倩 2006 物理学报 55 1832]
[17]	Bai Z Y, Deng D M, Guo Q 2012 Chin. Phys. B 21 64218
[18]	Lu D Q, Hu W, Guo Q 2009 Europhys. Lett. 86 44004

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