-
-
(1)西南科技大学矿物材料及应用研究所,绵阳621002; (2)西南科技大学矿物材料及应用研究所,绵阳621002中国科学院物理研究所,北京100080; (3)中国地质大学材料与工程学院,北京100083
-
-
[1] Huang Hao, Niu Ben, Tao Ting-Ting, Luo Shi-Ping, Wang Ying, Zhao Xiao-Hui, Wang Kai, Li Zhi-Qiang, Dang Wei. Ultrafast carrier kinetics at surface and interface of Sb2Se3 film by transient reflectance. Acta Physica Sinica, 2022, 71(6): 066402. doi: 10.7498/aps.71.20211714 [2] Meng Teng-Fei, Tian Jian-Feng, Zhou Yao-Yao. Selective reflection spectrum in a quasi-lambda four-level atomic system. Acta Physica Sinica, 2020, 69(1): 014206. doi: 10.7498/aps.69.20191099 [3] Liu Xue-Lu, Wu Jiang-Bin, Luo Xiang-Dong, Tan Ping-Heng. Dual-modulated photoreflectance spectra of semi-insulating GaAs. Acta Physica Sinica, 2017, 66(14): 147801. doi: 10.7498/aps.66.147801 [4] Qiao Xiao-Fen, Li Xiao-Li, Liu He-Nan, Shi Wei, Liu Xue-Lu, Wu Jiang-Bin, Tan Ping-Heng. Periodic oscillation in the reflection and photoluminescence spectra of suspended two-dimensional crystal flakes. Acta Physica Sinica, 2016, 65(13): 136801. doi: 10.7498/aps.65.136801 [5] Hou Yan-Jie, Hu Chun-Guang, Zhang Lei, Chen Xue-Jiao, Fu Xing, Hu Xiao-Tang. Characterization of effective conductive layer of nano organic thin film using reflectance spectroscopy. Acta Physica Sinica, 2016, 65(20): 200201. doi: 10.7498/aps.65.200201 [6] Lan Zhong, Xu Wei, Zhu Xia, Ma Xue-Hu. Reflection spectrum analysis of dropwise condensation with the clustering model. Acta Physica Sinica, 2011, 60(12): 120508. doi: 10.7498/aps.60.120508 [7] Zuo Fang-Yuan, Wang Yang, Wu Yi-Qun, Lai Tian-Shu. Study of ultrafast carrier dynamics in amorphous Ge2Sb2Te5 film by femtosecond-resolved reflectivity spectroscopy. Acta Physica Sinica, 2009, 58(10): 7250-7254. doi: 10.7498/aps.58.7250 [8] Liu Lei, Xu Sheng-Hua, Sun Zhi-Wei, Duan Li, Xie Jing-Chang, Lin Hai. An experimental study on colloidal crystals formed in two-component dispersion of charged particles. Acta Physica Sinica, 2008, 57(11): 7367-7373. doi: 10.7498/aps.57.7367 [9] Luo Xiang-Dong, Ji Chang-Jian, Wang Yu-Qi, Wang Jian-Nong. Low energy oscillatory phenomena in photoreflectance and photo-modulation reflectance spectra of GaMnAs films grown by low temperature molecular-beam epitaxy. Acta Physica Sinica, 2008, 57(8): 5277-5283. doi: 10.7498/aps.57.5277 [10] Zhao Xing, Fang Zhi_Liang, Mu Guo_Guang. Study on the colorimetric properties of the LED projection sources. Acta Physica Sinica, 2007, 56(5): 2537-2540. doi: 10.7498/aps.56.2537 [11] Chen Ding-An, Shen Li, Zhang Jia-Yu, Cui Yi-Ping. Colorimetrical study of colloidal CdSe quantum dots. Acta Physica Sinica, 2007, 56(11): 6340-6344. doi: 10.7498/aps.56.6340 [12] Song Gong-Bao, Liu Fu-Sheng, Peng Tong-Jiang, Liang Jing-Kui, Rao Guang-Hui. Influence of metal ions on the morphology and phase composition of titanium dioxide in TiO-2 muscovite nanocomposites*. Acta Physica Sinica, 2002, 51(12): 2793-2797. doi: 10.7498/aps.51.2793 [13] SU YI-XI, JU XIN, WEI KUN, CHI YUAN-BIN, HAN ZHENG一FU, SHI JUN-YAN, DENG JIE, SHI CHAO-SHU. REFLECTANCE SPECTRUM AND OPTICAL PROPERTIES OF NANO-wBN IN THE VUV REGION OF SYNCHROTRON RADIATION. Acta Physica Sinica, 1994, 43(10): 1718-1725. doi: 10.7498/aps.43.1718 [14] LU WEI, YU ZHI-YI, YE HONG-JUAN, XU WEN-LAN, MA KE-JUN, SHEN XUE-CHU. A STUDY ON THE FAR INFRARED REFLECTION SPECTRA OF Hg1-xMnxTe. Acta Physica Sinica, 1990, 39(3): 495-500. doi: 10.7498/aps.39.495 [15] YE HONG-JUAN, YU ZHI-YI, LU WEI, CHEN JIAN-XIANG, SHEN XUE-CHU, CAO NING, ZHENG JIA-QI, CHEN XI-SHEN, MIAO BAI-CAI. FAR-INFRARED REFLECTION SPECTRA OF THE HIGH-Tc OXIDE SUPERCONDUCTORS MBa2Cu3O7-δ (M = Y, Sm, Gd, Eu). Acta Physica Sinica, 1989, 38(5): 761-767. doi: 10.7498/aps.38.761 [16] WANG HUI, WANG RUO-ZHENG. ELECTROREFLECTANCE IN THE VISIBLE RANGE OF SPERCONDUCTING SYSTEM YBa2Cu3O7-δ. Acta Physica Sinica, 1989, 38(1): 145-148. doi: 10.7498/aps.38.145 [17] ZHANG GUANG-YIN, WANG BAO-MING. ABNORMAL SENSIBILITY OF REFLECTION STRUCTURES FOR WEAK VIBRATIONS ON THE SHORT-WAVE SIDE OF RESTSTRAHLEN BAND OF CRYSTALS. Acta Physica Sinica, 1984, 33(9): 1306-1313. doi: 10.7498/aps.33.1306 [18] QIAN YOU-HUA, CHEN LIANG-YAO. ELECTROLYTE ELECTROREFLECTANCE (EER) SPECTROSCOPY OF ION IMPLANTED SILICON LAYER. Acta Physica Sinica, 1982, 31(5): 646-653. doi: 10.7498/aps.31.646 [19] . . Acta Physica Sinica, 1966, 22(8): 955-957. doi: 10.7498/aps.22.955 [20] . ФУНДАМЕНТАЛЬНЫЕ СПЕКТРЫ ОТРАЖЕНИЯ КРИСТАЛЛОВ Cu2O И Ge——СТРУКТУРЫ ПОЛОС ОТРАЖЕНИЯ ДВУХ РАЗЛИЧНЫХ СВОЙСТВ. Acta Physica Sinica, 1965, 21(2): 324-328. doi: 10.7498/aps.21.324
Catalog
Metrics
- Abstract views: 7388
- PDF Downloads: 797
- Cited By: 0
Publishing process
- Received Date:
26 December 2001
- Published Online:
30 May 2005
下载:
