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Morphological characterization and nanoindentation hardness scatter evaluation for Cu-W thin films based on wavelet transform

Wang Yuan Bai Xuan-Yu Xu Ke-Wei

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Morphological characterization and nanoindentation hardness scatter evaluation for Cu-W thin films based on wavelet transform

Wang Yuan, Bai Xuan-Yu, Xu Ke-Wei
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  • Abstract views:  6952
  • PDF Downloads:  634
  • Cited By: 0
Publishing process
  • Received Date:  10 July 2003
  • Accepted Date:  30 October 2003
  • Published Online:  15 July 2004

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