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Reliability of SiN-based MIM capacitors in GaN MMIC

Wang Xin-Hua Wang Jian-Hui Pang Lei Chen Xiao-Juan Yuan Ting-Ting Luo Wei-Jun Liu Xin-Yu

Citation:

Reliability of SiN-based MIM capacitors in GaN MMIC

Wang Xin-Hua, Wang Jian-Hui, Pang Lei, Chen Xiao-Juan, Yuan Ting-Ting, Luo Wei-Jun, Liu Xin-Yu
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  • Abstract views:  9675
  • PDF Downloads:  908
  • Cited By: 0
Publishing process
  • Received Date:  23 December 2011
  • Accepted Date:  24 February 2012
  • Published Online:  05 September 2012

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