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A new method of characterizing the femtosecond pulse is proposed based on the self-diffraction process in a thin transparent bulk medium and the self-reference spectral interferometry. A simple device is designed based on this technique and is successful in characterizing a ～40 fs pulse at 800 nm centeral wavelength. The result is in accordance with that measured by a commercial self-reference spectral phase interferometry for direct electric reconstruction. Pulses in a spectral range from deep UV to middle IR are expected to be measured by this new method and corresponding simple device.
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Keywords:
- femtosecond laser pulses /
- self-reference spectral interferometry /
- self-diffraction /
- pulse measurement
[1] Walmsley I A, Dorrer C 2009 Adv. Opt. Photon. 1 308
[2] Trebino R 2000 Frequency-Resolved Optical Grating: The Measurement of Ultrashort Laser Pulses (Kluwer Academic Publishers)
[3] Trebino R, DeLong K, Fittinghoff D, Sweetser J, Krumbugel M A, Richman B A, Kane D J 1997 Rev. Sci. Instrum. 68 3277
[4] Trebino R, Bowlan P, Gabolde P, Gu X, Akturk S, Kimmel M 2009 Laser Photon. Rev. 3 314
[5] Wang Z H, Wei Z Y, Teng H, Wang P, Zhang J 2003 Acta Phys. Sin. 52 363 (in Chinese) [王兆华, 魏志义, 滕浩, 王鹏, 张杰 2003 物理学报 52 363]
[6] Iaconis C, Walmsley I A 1998 Opt. Lett. 23 792
[7] Baum P, Riedle E 2005 J. Opt. Soc. Am. B 22 1875
[8] Lepetit L, Chériaux G, Joffre M 1995 J. Opt. Soc. Am. B 12 2467
[9] Wang P, Zhao H, Zhao Y Y 2007 Acta Phys. Sin. 56 228 (in Chinese) [王 鹏, 赵 环, 赵研英 2007 物理学报 56 228]
[10] Dorrer C, Joffre M 2001 C. R. Acad. Sci. IV Phys. Astrophys. 2 1415
[11] Dorrer C, Kang I 2008 J. Opt. Soc. Am. B 25 A1
[12] Jullien A, Canova L, Albert O, Boschetto D, Antonucci L, Cha Y H, Rousseau J P, Chaudet P, Cheriaux G, Etchepare J, Kourtev S, Minkovski N, Saltiel S M 2007 Appl. Phys. B 87 595
[13] Oksenhendler T, Coudreau S, Forget N, Crozatier V, Grabielle S, Herzog R, Gobert O, Kaplan D 2010 Appl. Phys. B 99 7
[14] Trisorio A, Grabielle S, Divall M, Forget N, Hauri C P 2012 Opt. Lett. 37 2892
[15] Liu J, Okamura K, Kida Y, Kobayashi T 2010 Opt. Express 18 22245
[16] Liu J, Jiang Y, Kobayashi T, Li R, Xu Z 2012 JOSA B 29 29
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[1] Walmsley I A, Dorrer C 2009 Adv. Opt. Photon. 1 308
[2] Trebino R 2000 Frequency-Resolved Optical Grating: The Measurement of Ultrashort Laser Pulses (Kluwer Academic Publishers)
[3] Trebino R, DeLong K, Fittinghoff D, Sweetser J, Krumbugel M A, Richman B A, Kane D J 1997 Rev. Sci. Instrum. 68 3277
[4] Trebino R, Bowlan P, Gabolde P, Gu X, Akturk S, Kimmel M 2009 Laser Photon. Rev. 3 314
[5] Wang Z H, Wei Z Y, Teng H, Wang P, Zhang J 2003 Acta Phys. Sin. 52 363 (in Chinese) [王兆华, 魏志义, 滕浩, 王鹏, 张杰 2003 物理学报 52 363]
[6] Iaconis C, Walmsley I A 1998 Opt. Lett. 23 792
[7] Baum P, Riedle E 2005 J. Opt. Soc. Am. B 22 1875
[8] Lepetit L, Chériaux G, Joffre M 1995 J. Opt. Soc. Am. B 12 2467
[9] Wang P, Zhao H, Zhao Y Y 2007 Acta Phys. Sin. 56 228 (in Chinese) [王 鹏, 赵 环, 赵研英 2007 物理学报 56 228]
[10] Dorrer C, Joffre M 2001 C. R. Acad. Sci. IV Phys. Astrophys. 2 1415
[11] Dorrer C, Kang I 2008 J. Opt. Soc. Am. B 25 A1
[12] Jullien A, Canova L, Albert O, Boschetto D, Antonucci L, Cha Y H, Rousseau J P, Chaudet P, Cheriaux G, Etchepare J, Kourtev S, Minkovski N, Saltiel S M 2007 Appl. Phys. B 87 595
[13] Oksenhendler T, Coudreau S, Forget N, Crozatier V, Grabielle S, Herzog R, Gobert O, Kaplan D 2010 Appl. Phys. B 99 7
[14] Trisorio A, Grabielle S, Divall M, Forget N, Hauri C P 2012 Opt. Lett. 37 2892
[15] Liu J, Okamura K, Kida Y, Kobayashi T 2010 Opt. Express 18 22245
[16] Liu J, Jiang Y, Kobayashi T, Li R, Xu Z 2012 JOSA B 29 29
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