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Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methods

Li Long Wang Ming Ni Hai-Bin Shen Tian-Yi

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Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methods

Li Long, Wang Ming, Ni Hai-Bin, Shen Tian-Yi
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  • Abstract views:  6552
  • PDF Downloads:  985
  • Cited By: 0
Publishing process
  • Received Date:  24 September 2013
  • Accepted Date:  06 November 2013
  • Published Online:  05 March 2014

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