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Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methods

Li Long Wang Ming Ni Hai-Bin Shen Tian-Yi

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Introduction of two-dimensional defects in inverse opal films by means of planar lithography and sol-gel co-assembly methods

Li Long, Wang Ming, Ni Hai-Bin, Shen Tian-Yi
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  • By applying planar lithography and sol-gel co-assembly methods, the designed two-dimensional defects were introduced in inverse opal films. Composite colloidal crystal films which can turn into inverse opal films after calcination were fabricated by sol-gel co-assembly method. Photoresist patterns produced by planer lithograph either on silicon or composite colloidal film/silicon substrate were used as the sacrificial structure to form the designed defects. To form the embedded defects in inverse opal films, a layer of composite colloidal crystal film was assembled on the photoresist patterns. After calcination, both PS spheres and photoresist were removed, and the designed defects were introduced in the inverse opal films. Influence of the photoresist patterns on self-assembled PS particles was also characterized.
    • Funds: Project supported by the National Natural Science Foundation of China (Grant Nos. 61178044, 91123015), the Jiangsu province prospective joint research project (Grant No. BY2012005), and the University Postgraduate Research and Innovation Project of Jiangsu Province, China (Grant No.CXZZ02_0405).
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    Yu L S, Edmund C, Vince H, Villeneuve P R, Joannopulos J D 1998 Science 282 274

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    Liu C, Chen L 2004 Opt. Express 12 2616

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    Krauss T F 2003 Phys. Status Solidi A 197 688

    [5]

    Ye Y H, Mayer T S, Khoo I C, Divliansky I B, Abrams N, Mallouk T E 2002 J. Mater. Chem. 12 3637

    [6]

    Rinne S A, Santamaría F G, Braun P V 2008 Nat. Photonics 2 52

    [7]

    Yan Q F, Zhou Z C, Zhao X S, Chua S J 2005 Adv. Mater. 17 1917

    [8]

    Hatton B, Mishchenko L, Davis S, Sandhade K H, Aizenberg J 2010 Proc. Natl. Acad. Sci. USA 107 10354

    [9]

    Mishchenko L, Hatton B, Kolle M, Aizenberg J 2012 Small 8 1904

    [10]

    Burgess I B, Aizenberg J, Loncar M http: //arxiv.org/abs/1211.6811 2013-9-17

    [11]

    Ni H B, Wang M, Chen W 2012 Acta Phys. Sin. 61 084211 (in Chinese) [倪海彬, 王鸣, 陈威 2012 物理学报 61 084211]

    [12]

    Ni H B, Wang M, Chen W 2011 Opt. Express 19 25900

  • [1]

    Soong I J, Park Y, Jeon H 2001 J. Korean Phys. Soc. 39 994

    [2]

    Yu L S, Edmund C, Vince H, Villeneuve P R, Joannopulos J D 1998 Science 282 274

    [3]

    Liu C, Chen L 2004 Opt. Express 12 2616

    [4]

    Krauss T F 2003 Phys. Status Solidi A 197 688

    [5]

    Ye Y H, Mayer T S, Khoo I C, Divliansky I B, Abrams N, Mallouk T E 2002 J. Mater. Chem. 12 3637

    [6]

    Rinne S A, Santamaría F G, Braun P V 2008 Nat. Photonics 2 52

    [7]

    Yan Q F, Zhou Z C, Zhao X S, Chua S J 2005 Adv. Mater. 17 1917

    [8]

    Hatton B, Mishchenko L, Davis S, Sandhade K H, Aizenberg J 2010 Proc. Natl. Acad. Sci. USA 107 10354

    [9]

    Mishchenko L, Hatton B, Kolle M, Aizenberg J 2012 Small 8 1904

    [10]

    Burgess I B, Aizenberg J, Loncar M http: //arxiv.org/abs/1211.6811 2013-9-17

    [11]

    Ni H B, Wang M, Chen W 2012 Acta Phys. Sin. 61 084211 (in Chinese) [倪海彬, 王鸣, 陈威 2012 物理学报 61 084211]

    [12]

    Ni H B, Wang M, Chen W 2011 Opt. Express 19 25900

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Publishing process
  • Received Date:  24 September 2013
  • Accepted Date:  06 November 2013
  • Published Online:  05 March 2014

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