搜索

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

表层氟化温度对聚乙烯中空间电荷积累的影响

陈暄 安振连 刘晨霞 张冶文 郑飞虎

引用本文:
Citation:

表层氟化温度对聚乙烯中空间电荷积累的影响

陈暄, 安振连, 刘晨霞, 张冶文, 郑飞虎

Influence of surface fluorination temperature on space charge accumulation in polyethylene

Chen Xuan, An Zhen-Lian, Liu Chen-Xia, Zhang Ye-Wen, Zheng Fei-Hu
PDF
导出引用
  • 在实验室反应釜中于不同的温度(35 ℃, 55 ℃和70 ℃) 下, 以氟气体积浓度为12.5%的氟/氮混合气对热压制备的聚乙烯(PE) 片状试样(厚约0.8 mm) 进行了相同时间(2 h) 的表层氟化改性. 利用压力波法研究了氟化温度对PE中空间电荷积累的影响. 结果显示, 随着氟化温度的提高直流高压作用下的氟化试样中的空间电荷积累明显减少, 这个70 ℃的氟化试样中几乎没有空间电荷. 衰减全反射红外分析表明, 氟化引起了试样表层化学组成的本质变化及氟化度随氟化温度的明显提高. 接触角测量与表面能计算间接地表明了这些氟化层有显著增大的介电常数. 开路热刺激放电电流测量进一步揭示了这些氟化层 不同的电荷捕获特性, 及随着氟化温度的提高氟化层对化学杂质从半导性电极向PE扩散的增强的阻挡特性, 因此表明氟化层中自由体积的相应减小. 表层自由体积的减小对抑制空间电荷的积累, 比介电常数的增大和电荷陷阱的变化起到更加显著的作用.
    Polyethylene (PE) discs prepared by hot-pressing, each with a thickness of 0.8 mm, are surface fluorinated in a laboratory vessel by an F2/N2 mixture containing 12.5% F2 by volume at different temperatures of 35, 55, and 70 ℃ for the same time of 2 h. The influence of fluorination temperature on space charge accumulation in PE is investigated by the pressure wave propagation method. The results show an obvious decrease in space charge accumulation in the fluorinated sample subject to a direct current high voltage with the increase of fluorination temperature, and there exists almost no charge accumulation in the sample fluorinated at 70 ℃. Attenuated total reflection infrared analyses indicate a substantial change in chemical composition of the sample surface layers by the fluorinations and an obvious increase in degree of fluorination with fluorination temperature increasing. Contact angle measurements and surface energy calculations indirectly indicate a significant increase in permittivity of the fluorinated layers by the fluorinations. Open-circuit thermally stimulated discharge current measurements further reveal different charge trapping properties of the fluorinated layers and the improved barrier properties of the fluorinated layer to the diffusion of the chemical species from the semi-conductive electrode to the PE with increase of fluorination temperature, thus indicating a corresponding decrease in free volume of the surface layer. The decrease in the free volume plays a more important role in suppressing the space charge accumulation, compared with the increase in permittivity and the change in charge trap.
    • 基金项目: 国家自然科学基金项目(批准号: 50977065, 51077101) 与电力设备电气绝缘国家重点实验室(EIPE11210) 资助的课题.
    • Funds: Project supported by the National Natural Science Foundation of China (Grant Nos. 50977065, 51077101) and State Key Laboratory of Electrical Insulation and Power Equipment (Grant No. EIPE11210).
    [1]

    Montanari G C, Fabiani D 2000 IEEE Trans. DEI 7 322

    [2]

    Zhang Y, Lewiner J, Alquie C, Hampton N 1996 IEEE Trans. DEI 3 778

    [3]

    Lewis T J 2002 IEEE Trans. DEI 9 717

    [4]

    Jones J P, Llewellyn J P Lewis T J 2005 IEEE Trans. DEI 12 951

    [5]

    Chen G, Tanaka Y, Takada T, Zhong L 2004 IEEE Trans. DEI 11 113

    [6]

    Murakami Y, Mitsumoto S, Fukuma M, Hozumi N, Nagao M 20002 Electr. Eng. Jpn. 138 19

    [7]

    An Z, Yang Q, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 105 064102

    [8]

    An Z, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 106 104112

    [9]

    Jiang Y, An Z, Liu C, Zheng F, Zhang Y 2010 IEEE Trans. DEI 17 1814

    [10]

    An Z L, Liu C X, Chen X, Zheng F H, Zhang Y W 2012 Acta Phys. Sin. 61 098201 (in Chinese) [安振连, 刘晨霞, 陈暄, 郑飞虎, 张冶文 2012 物理学报 61 098201]

    [11]

    Owens D K, Wendt R C 1969 J. Appl. Polym. Sci. 13 1741

    [12]

    Lewiner J 1986 IEEE Trans. Electr. Insul. EI-21 351

    [13]

    Liu C X, An Z L, Chen X, Zheng F H, Zhang Y 2011 Proceedings of International Symposium on Electrical Insulating Materials (ISEIM) Kyoto, Japan, September 6-11, 2011 p 54

    [14]

    Kharitonov A P 2008 Prog. Org. Coat. 61 192

    [15]

    Ho Y F F, Chen G, Davies A E, Swingler S G, Sutton S J, Hampton R N 2003 IEEE Trans. DEI 10 393

  • [1]

    Montanari G C, Fabiani D 2000 IEEE Trans. DEI 7 322

    [2]

    Zhang Y, Lewiner J, Alquie C, Hampton N 1996 IEEE Trans. DEI 3 778

    [3]

    Lewis T J 2002 IEEE Trans. DEI 9 717

    [4]

    Jones J P, Llewellyn J P Lewis T J 2005 IEEE Trans. DEI 12 951

    [5]

    Chen G, Tanaka Y, Takada T, Zhong L 2004 IEEE Trans. DEI 11 113

    [6]

    Murakami Y, Mitsumoto S, Fukuma M, Hozumi N, Nagao M 20002 Electr. Eng. Jpn. 138 19

    [7]

    An Z, Yang Q, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 105 064102

    [8]

    An Z, Xie C, Jiang Y, Zheng F, Zhang Y 2009 J. Appl. Phys. 106 104112

    [9]

    Jiang Y, An Z, Liu C, Zheng F, Zhang Y 2010 IEEE Trans. DEI 17 1814

    [10]

    An Z L, Liu C X, Chen X, Zheng F H, Zhang Y W 2012 Acta Phys. Sin. 61 098201 (in Chinese) [安振连, 刘晨霞, 陈暄, 郑飞虎, 张冶文 2012 物理学报 61 098201]

    [11]

    Owens D K, Wendt R C 1969 J. Appl. Polym. Sci. 13 1741

    [12]

    Lewiner J 1986 IEEE Trans. Electr. Insul. EI-21 351

    [13]

    Liu C X, An Z L, Chen X, Zheng F H, Zhang Y 2011 Proceedings of International Symposium on Electrical Insulating Materials (ISEIM) Kyoto, Japan, September 6-11, 2011 p 54

    [14]

    Kharitonov A P 2008 Prog. Org. Coat. 61 192

    [15]

    Ho Y F F, Chen G, Davies A E, Swingler S G, Sutton S J, Hampton R N 2003 IEEE Trans. DEI 10 393

计量
  • 文章访问数:  5567
  • PDF下载量:  403
  • 被引次数: 0
出版历程
  • 收稿日期:  2011-09-30
  • 修回日期:  2011-11-25
  • 刊出日期:  2012-07-05

/

返回文章
返回