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中国物理学会期刊

Eu掺杂TbMnO3多晶材料的介电性质

CSTR: 32037.14.aps.59.2815

Dielectric properties of Eu-doped polycrystalline TbMnO3

CSTR: 32037.14.aps.59.2815
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  • 采用固相反应法制备了Tb0.8Eu0.2MnO3多晶材料.对样品的X射线衍射(XRD)分析表明Eu3+固溶于TbMnO3中.测量了样品在低温(100 K ≤T≤ 300 K)和低频下(200 Hz≤f≤100 kHz)的复介电性质.在此温度区间内发现了两个介电弛豫峰.经分析认为低温峰(T≈170 K)起源于局域载流子漂移引起的偶极子极化效应,而高温峰(T≈290 K)则是由离子电导产生的边界和界面层的电容效应引起的.电阻率的测量显示在低温下(T≈230 K)存在明显的导电机制转变.

     

    Polycrystalline bulk Tb0.8Eu0.2MnO3 was prepared by solid phase reaction. The XRD analysis of the sample showed that the Eu3+ had been doped in TbMnO3. Dielectric properties were examined as functions of temperature (100 K ≤T≤ 300 K) and frequency (200 Hz≤ f ≤100 kHz). Two dielectric relaxations were found in these ranges. By means of analysis the low-temperature relaxation was ascribed to the dipolar effects induced by carriers hopping; and the high-temperature relaxation was found to originate from the internal barrier-layer capacitor effects of ion conductivity. The measurement of resistivity showed that there is a marked transition around 230 K, indicating that different conductive mechanisms underlay the transport processes.

     

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