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Effect of Ti(Cr) underlayer on the magnetic properties and microstructure of CoCrTa film for perpendicular magnetic recording media

Zhen Cong-Mian Ma Li Zhang Jin-Juan Liu Ying Nie Xiang-Fu

Effect of Ti(Cr) underlayer on the magnetic properties and microstructure of CoCrTa film for perpendicular magnetic recording media

Zhen Cong-Mian, Ma Li, Zhang Jin-Juan, Liu Ying, Nie Xiang-Fu
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  • Received Date:  02 August 2006
  • Accepted Date:  01 September 2006
  • Published Online:  11 July 2007

Effect of Ti(Cr) underlayer on the magnetic properties and microstructure of CoCrTa film for perpendicular magnetic recording media

  • 1. 河北师范大学物理科学与信息工程学院,石家庄 050016

Abstract: C/CoCrTa/X (X=Cr, Ti) films were fabricated with DC facing target magnetron sputtering apparatus. Their magnetic properties and microstructure were characterized by vibrating sample magnetometer (VSM), X-ray diffraction (XRD), and scan probe microscope (SPM), respectively. The experimental results indicate that the Ti underlayer can induce the c-axis orientation of Co grain in the direction perpendicular to the film surface. For samples with Ti underlayer, the grain size and the surface roughness are relatively finer, and magnetic domains can be observed obviously. These results show that the sample with Ti underlayer is more suitable for the perpendicular magnetic recording media.

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