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Buck, boost and buck-boost converters are three basic switching DC-DC converters. Current mode controlled switching DC-DC converters have two boundaries in a wide circuit parameters variation range. Based on the ramp up and ramp down slopes of the inductor current before and after the turn on of power switch for switching DC-DC converters, a unified model of the current mode controlled switching DC-DC converters with ramp compensation is established in this paper. Only three parameters appear in this model after dimensionless normalization, from which the dynamical behaviors of switching DC-DC converters in continuous conduction mode (CCM) and discontinuous conduction mode (DCM) can be effectively illustrated. By utilizing the proposed unified model, two orbit state shifting borderline equations are derived, from which three operation state regions namely the stable period-one region, CCM robust chaos region, and DCM weak chaos and strong intermittence region, of switching DC-DC converters can be determined. The two-dimensional parameter bifurcation diagrams of switching DC-DC converters and circuit experimental observations of current mode controlled buck converter verify the analysis results of the partitioning of operation state regions by two borderline equations.
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Keywords:
- switching converter /
- ramp compensation /
- dynamical characteristic /
- operation state region
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[15] ]Parag J, Banerjee S 2003 Int. J. Bifurc. Chaos 13 3341
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[17] ]Banerjee S, Parui S, Gupta A 2004 IEEE Trans. Circ. Syst. Ⅱ 51 649
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[19] ]Bao B C, Xu J P, Liu Z 2009 Acta Phys. Sin. 58 2949 (in Chinese) [包伯成、 许建平、 刘中 2009物理学报 58 2949]
[20] ]Bao B C, Xu J P, Liu Z 2009 Chin. Phys. B 18 4742
[21] ]Kabe T, Parui S, Torikai H, Banerjee S, Saito T 2007 IEICE Tran. Fund. E90-A 448
[22] ]Deane J H B, Hamill D C 1996 Electron. Lett. 32 1045
[23] ]Giral R, El Aroudi A, Martinez-Salamero L, Leyva R, Maixe J 2001 Electron. Lett. 37 274
[24] ]Liu Z, Zhu X H, Hu W, Jiang F 2007 Int. J. Bifur. Chaos 17 1735
[25] ]Xu J P, Zhou G H, He M Z 2009 IEEE Trans. Indust. Electron. 56 3222
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[1] [1]Donato C, Giuseppe G 2006 Nonlin. Dyn. 44 251
[2] [2]Wang F Q, Zhang H, Ma X K 2008 Acta Phys. Sin. 57 2842 (in Chinese) [王发强、 张浩、 马西奎 2008 物理学报 57 2842]
[3] [3]Wang F Q, Zhang H, Ma X K 2008 Acta Phys. Sin. 57 1522 (in Chinese)[王发强、 张浩、 马西奎 2008 物理学报 57 1522]
[4] [4]Wang X M, Zhang B, Qiu D Y 2008 Acta Phys. Sin. 57 2728 (in Chinese)[王学梅、 张波、 丘东元 2008 物理学报 57 2728]
[5] [5]Yang R, Zhang B, Chu L L 2008 Acta Phys. Sin. 57 2770 (in Chinese)[杨汝、 张波、 褚利丽 2008 物理学报 57 2770]
[6] [6]Zhao Y B, Luo X S, Fang J Q, Wang B H 2005 Acta Phys. Sin. 54 5022 (in Chinese)[赵益波、 罗晓曙、 方锦清、 汪秉宏 2005 物理学报 54 5022]
[7] [7]Tse C K, Bernardo M D 2002 Proc. IEEE 90 768
[8] [8]Zhao Y B, Zhang D Y, Zhang C J 2007 Chin. Phys. B 16 933
[9] [9]Ren H P 2006 Acta Electron. Sin. 34 784 (in Chinese) [任海鹏 2006 电子学报 34 784]
[10] ]Zhou Y F, Chen J Y, Ke D M 2005 Acta Electron. Sin. 33 915 (in Chinese)[周宇飞、 陈军宇、 柯导明 2005 电子学报 33 915]
[11] ]Zhou Y F, Chen J N, Iu H H C, Tse C K 2008 Int. J. Bifurc. Chaos 18 121
[12] ]Zhanybai T Z, Evgeniy A S, Erik M 2003 IEEE Trans. Circ. Syst. Ⅰ 50 1047
[13] ]Iu H H C, Tse C K 2003 IEEE Trans. Circ. Syst. Ⅰ 50 679
[14] ]Wong S C, Tse C K, Tam K C 2004 Int. J. Bifurc. Chaos 14 1971
[15] ]Parag J, Banerjee S 2003 Int. J. Bifurc. Chaos 13 3341
[16] ]Dai D, Ma X K, Li X F 2003 Acta Phys. Sin. 52 2729 (in Chinese) [戴栋、 马西奎、 李小峰 2003 物理学报 52 2729]
[17] ]Banerjee S, Parui S, Gupta A 2004 IEEE Trans. Circ. Syst. Ⅱ 51 649
[18] ]Parui S, Banerjee S 2003 IEEE Trans. Circ. Syst. Ⅰ 50 1464
[19] ]Bao B C, Xu J P, Liu Z 2009 Acta Phys. Sin. 58 2949 (in Chinese) [包伯成、 许建平、 刘中 2009物理学报 58 2949]
[20] ]Bao B C, Xu J P, Liu Z 2009 Chin. Phys. B 18 4742
[21] ]Kabe T, Parui S, Torikai H, Banerjee S, Saito T 2007 IEICE Tran. Fund. E90-A 448
[22] ]Deane J H B, Hamill D C 1996 Electron. Lett. 32 1045
[23] ]Giral R, El Aroudi A, Martinez-Salamero L, Leyva R, Maixe J 2001 Electron. Lett. 37 274
[24] ]Liu Z, Zhu X H, Hu W, Jiang F 2007 Int. J. Bifur. Chaos 17 1735
[25] ]Xu J P, Zhou G H, He M Z 2009 IEEE Trans. Indust. Electron. 56 3222
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