-
-
[1] Ephstein E M 1970 Sov. Phys. JETP 41 2213
[2] Chow R, Taylor J R, Wu Z L 2000 Appl. Opt. 39 650
[3] Li B C, Martin S, Welsch E 1999 SPIE 3902 145
[4] Wu Z L, Fan Z X 1989 Acta Opt. Sin. 9 630 (in Chinese) [吴周令、范正修 1989 光学学报 9 630]
[5] Commandré M, Rolhe P, Borgogno J P, Albrand J 1994 Optical Interference Coatings, Proc. Soc. Photo-Opt. Instrum. 2253 1253
[6] Temple P A 1979 Appl. Phys. Lett. 34 677
[7] Welsch E, Walther H G, Kühn H J 1987 J. Physique 48 419
[8] Lehan J P, Mao Y, Bovard B G, Macleod H A 1991 Thin Solid Films 203 227
[9] Borgogno J P, Flory F, Roche P, Schmitt B, Albrand G, Pelletier E, Macleod H A 1984 Appl. Opt. 23 3567
[10] Bubenzer A, Koidl P 1984 Appl. Opt. 23 2886
[11] Power J F 1990 Appl. Opt. 29 52
[12] Fan S H, He H B, Shao J D, Fan Z X, Zhao Y A 2006 Acta Phys. Sin. 55 758 (in Chinese) [范树海、贺洪波、邵建达、范正修、赵元安 2006 物理学报 55 758]
[13] Guntau M, Triebel W 2006 Review of Scientific Instruments 71 2279
[14] Li B C, Xiong S M, Blaschke H, Ristau D 2006 Chinese Journal of Lasers 33 823 (in Chinese) [李斌成、熊盛明、Holger Blaschke、Detlev Ristau 2006 中国激光 33 823]
[15] Dijon J, Rafin B, Pellé C 2000 Proc. SPIE 3902 158
计量
- 文章访问数: 9559
- PDF下载量: 802