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Zhou Xin-Jie, Li Lei-Lei, Zhou Yi, Luo Jing, Yu Zong-Guang. Back-gate bias effect on partially depleted SOI/MOS back-gate performances under radiation condition. Acta Physica Sinica,
2012, 61(20): 206102.
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Yu Zhi-Qiang. Electronic structure and photoelectric properties of OsSi2 epitaxially grown on a Si(111) substrate. Acta Physica Sinica,
2012, 61(21): 217102.
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Chen Cheng-Zhao, Zheng Yuan-Yu, Huang Shi-Hao, Li Cheng, Lai Hong-Kai, Chen Song-Yan. Epitaxial growth of thick Ge layers with low dislocation density on silicon substrate by UHV/CVD. Acta Physica Sinica,
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Xu Sheng-Rui, Zhang Jin-Cheng, Li Zhi-Ming, Zhou Xiao-Wei, Xu Zhi-Hao, Zhao Guang-Cai, Zhu Qing-Wei, Zhang Jin-Feng, Mao Wei, Hao Yue. The triangular pits eliminate of (1120) a-plane GaN growth by metal-orgamic chemical vapor deposition. Acta Physica Sinica,
2009, 58(8): 5705-5708.
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Xi Guang-Yi, Ren Fan, Hao Zhi-Biao, Wang Lai, Li Hong-Tao, Jiang Yang, Zhao Wei, Han Yan-Jun, Luo Yi. Influence of pit defects on AlGaN surface and dislocation defects in GaN buffer layer on current collapse of AlGaN/GaN HEMTs. Acta Physica Sinica,
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Chu Rui-Qing, Xu Zhi-Jun, Li Guo-Rong, Zeng Hua-Rong, Yu Han-Feng, Shao Xin, Luo Hao-Su, Yin Qing-Rui. Ultrahigh piezoelectric response along some special cleavage plane in BaTiO3 single-crystals. Acta Physica Sinica,
2005, 54(2): 935-938.
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Sun Xian-Kai, Lin Bi-Xia, Zhu Jun-Jie, Zhang Yang, Fu Zhu-Xi. Studies on the strain and its effect on defects in heteroepitaxial ZnO films prepared by LP-OCVD method. Acta Physica Sinica,
2005, 54(6): 2899-2903.
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HAN DA-XING, WANG WAN-LU, ZHANG ZHI. MECHANISM OF ELECTROLUMINESCENCE FROM a-Si:H AND STUDIES OF DEFECT ENERGY DISTRIBUTION IN INTRINSIC LAYER OF a-Si:H SOLAR CELLS BY ELECTROLUMINESCENCE SPECTRA. Acta Physica Sinica,
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KANG JUN-YONG, HUANG QI-SHENG, T.OGAWA. DEFECTS IN GaN EPILAYERS. Acta Physica Sinica,
1999, 48(7): 1372-1380.
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LU FANG, GONG DA-WEI, SUN HENG-HUI. A STUDY OF THE INTERFACIAL DEFECTS IN MOLECULAR BEAM EPITAXIAL SILICON. Acta Physica Sinica,
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1988, 37(7): 1203-1208.
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WU FENG-MEI, LAI QI-JI, SHEN BO, ZHOU GUO-QUAN. A STUDY OF ELECTRON IRRADIATION-INDUCED DEFECTS IN Si LAYERS. Acta Physica Sinica,
1986, 35(5): 638-642.
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1983, 32(5): 685-688.
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GUO CHANG-LIN. OBSERVATION OF DEFECTS IN β-SILICON CARBIDE EPITAXIAL FILM. Acta Physica Sinica,
1982, 31(11): 1526-1533.
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1959, 15(6): 318-324.
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