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Study of conductive property for a N-VDMOS interface trap under X-ray radiation

Sun Guang-Ai Hu Gang-Yi Yang Mo-Hua Xu Shi-Liu Zhang Zheng-Fan Liu Yu-Kui He Kai-Quan Zhong Yi

Citation:

Study of conductive property for a N-VDMOS interface trap under X-ray radiation

Sun Guang-Ai, Hu Gang-Yi, Yang Mo-Hua, Xu Shi-Liu, Zhang Zheng-Fan, Liu Yu-Kui, He Kai-Quan, Zhong Yi
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  • Abstract views:  7655
  • PDF Downloads:  1095
  • Cited By: 0
Publishing process
  • Received Date:  06 June 2007
  • Accepted Date:  24 July 2007
  • Published Online:  20 March 2008

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