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Zhang Sheng-Bo, Zhang Huan-Hao, Chen Zhi-Hua, Zheng Chun. Influence of different interface component distributions on Richtmyer-Meshkov instability. Acta Physica Sinica,
2023, 72(10): 105202.
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Niu Di, Jiang Han. Influence of interface kinetics parameters on the overall fluctuation instability of the interface morphology of deep cell crystal. Acta Physica Sinica,
2022, 71(16): 168101.
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Gou Shi-Long, Ma Wu-Ying, Yao Zhi-Bin, He Bao-Ping, Sheng Jiang-Kun, Xue Yuan-Yuan, Pan Chen. Radiation mechanism of gate-controlled lateral PNP bipolar transistors in the hydrogen environment. Acta Physica Sinica,
2021, 70(15): 156101.
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Zhao Jin-Yu, Yang Jian-Qun, Dong Lei, Li Xing-Ji. Hydrogen soaking irradiation acceleration method: application to and damage mechanism analysis on 3DG111 transistors. Acta Physica Sinica,
2019, 68(6): 068501.
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Jiang Ping-Guo, Wang Zheng-Bing, Yan Yong-Bo, Liu Wen-Jie. First-principles study of absorption mechanism of hydrogen on W20O58 (010) surface. Acta Physica Sinica,
2017, 66(24): 246801.
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Jiang Ping-Guo, Wang Zheng-Bing, Yan Yong-Bo. First-principles study on adsorption mechanism of hydrogen on tungsten trioxide surface. Acta Physica Sinica,
2017, 66(8): 086801.
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Liu Jun, Feng Qi-Jing, Zhou Hai-Bing. Simulation study of interface instability in metals driven by cylindrical implosion. Acta Physica Sinica,
2014, 63(15): 155201.
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Xia Tong-Jun, Dong Yong-Qiang, Cao Yi-Gang. Effects of surface tension on Rayleigh-Taylor instability. Acta Physica Sinica,
2013, 62(21): 214702.
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Shi Lei, Qian Mu-Yang, Xiao Kun-Xiang, Li Ming. Simulation study on hydrogen penning source discharge at low pressure. Acta Physica Sinica,
2013, 62(17): 175205.
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Sun Peng, Du Lei, Chen Wen-Hao, He Liang, Zhang Xiao-Fang. A radiation degradation model of metal-oxide-semiconductor field effect transistor. Acta Physica Sinica,
2012, 61(10): 107803.
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Sun Peng, Du Lei, Chen Wen-Hao, He Liang. A latent defect degradation model of metal-oxide-semiconductor field effect transistor based on pre-irradiation1/f noise. Acta Physica Sinica,
2012, 61(6): 067801.
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Liu Hua-Min, Fan Yong-Sheng, Tian Shi-Hai, Zhou Wei, Chen Xu. Molecular dynamics simulation for the effect of hydrogen on the water of pressurized water reactors. Acta Physica Sinica,
2012, 61(6): 062801.
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Cao Jian-Min, He Wei, Huang Si-Wen, Zhang Xu-Lin. Dependence of the DC stress negative bias temperature instability effect on basic device parameters in pMOSFET. Acta Physica Sinica,
2012, 61(21): 217305.
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Chen Wei-Hua, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, He Liang, Zhang Tian-Fu, Zhang Xue. A model considering the ionizing radiation effects in MOS structure. Acta Physica Sinica,
2009, 58(6): 4090-4095.
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Lin Ruo-Bing, Wang Xin-Juan, Feng Qian, Wang Chong, Zhang Jin-Cheng, Hao Yue. Study on mechanism of AlGaN/GaN high electron mobility transistors by high temperature Schottky annealing. Acta Physica Sinica,
2008, 57(7): 4487-4491.
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Sun Guang-Ai, Hu Gang-Yi, Yang Mo-Hua, Xu Shi-Liu, Zhang Zheng-Fan, Liu Yu-Kui, He Kai-Quan, Zhong Yi. Study of conductive property for a N-VDMOS interface trap under X-ray radiation. Acta Physica Sinica,
2008, 57(3): 1872-1877.
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Li Rui-Min, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin. A 1/f noise based research of radiation induced interface trap buildup process. Acta Physica Sinica,
2007, 56(6): 3400-3406.
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Liu Hong Xia, Zheng Xue Feng, Hao Yue. Degradation and physical mechanism of NBT in deep submicron PMOSFET's. Acta Physica Sinica,
2005, 54(3): 1373-1377.
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Chao Ming-Ju, Ding Pei, Zhang Hong-Rui, Guo Mao-Tian, Liang Er-Jun. The effect of hydrogen and nitrogen on the growth of boron carbonitride nanotubes. Acta Physica Sinica,
2004, 53(3): 936-941.
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JIA WEI-YI, ZHANG PENG-XIANG. ON THE OPTIMUM COMPENSATION OF THE TEMPERATURE INSTABILITIES CAUSED BY THE MAGNETOCRYSTALLINE ANISOTROPY FIELD IN YIG MICROWAVE DEVICES. Acta Physica Sinica,
1976, 25(3): 254-264.
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