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Degradation and physical mechanism of NBT in deep submicron PMOSFET's

Liu Hong Xia Zheng Xue Feng Hao Yue

Citation:

Degradation and physical mechanism of NBT in deep submicron PMOSFET's

Liu Hong Xia, Zheng Xue Feng, Hao Yue
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  • Abstract views:  7567
  • PDF Downloads:  916
  • Cited By: 0
Publishing process
  • Received Date:  24 March 2004
  • Accepted Date:  02 September 2004
  • Published Online:  17 March 2005

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