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A model considering the ionizing radiation effects in MOS structure

Chen Wei-Hua Du Lei Zhuang Yi-Qi Bao Jun-Lin He Liang Zhang Tian-Fu Zhang Xue

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A model considering the ionizing radiation effects in MOS structure

Chen Wei-Hua, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, He Liang, Zhang Tian-Fu, Zhang Xue
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  • Abstract views:  9269
  • PDF Downloads:  1332
  • Cited By: 0
Publishing process
  • Received Date:  14 August 2008
  • Accepted Date:  11 November 2008
  • Published Online:  05 March 2009

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