Influences of electrode separation on structural properties of μc-Si<sub>1-<i>x</i></sub>Ge<sub><i>x</i></sub>:H thin films
Acta Physica Sinica
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Acta Phys. Sin  2014, Vol. 63 Issue (7): 076801     doi:10.7498/aps.63.076801
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Archive| Adv Search  |   
Influences of electrode separation on structural properties of μc-Si1-xGex:H thin films
Cao Yu1 2, Zhang Jian-Jun2, Yan Gan-Gui1, Ni Jian2, Li Tian-Wei2, Huang Zhen-Hua2, Zhao Ying2
1. Electrical Engineering College, Northeast Dianli University, Jilin 132012, China;
2. Institute of Photo-electronic Thin Film Devices and Technique of Nankai University, Key Laboratory of Photo-electronics Thin Film Devices and Technique of Tianjin, Key Laboratory of Optoelectronics Information Science and Technology,Chinese Ministry of Education, Tianjin 300071, China
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