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本工作研究了Ho3+离子在宽禁带半导体ZnS中的辐射跃迁和无辐射过程。用发射谱线的积分光强和激发态寿命获得ZnS:Ho3+的强度参数Ωλ,同时计算了九个激发态的辐射跃迁几率和能级寿命。另外,通过在不同温度下测定Ho3+离子5G6,3K8,5F2,5F3和5S2(5F4)能级的发射光强和寿命的方法,研究了这几个激发态间的无辐射过程,其中5G6,3K8,5F2和5F3这四个能级是处于热平衡状态,而5F3与5S2(5F4)能级间存在五个声子((1/n)ωLo=351cm-1)参与的多声子弛豫过程。The radiative transition and nonradiative process have been studied for Ho3+ ions in ZnS semiconductor. From the integrated emission intensity and excited state lifetime, the intensity uarameters of ZnS:Ho3+ were obtained and radiation probabilities and lifetimes of Ho3+ ion's nine energy levels were calculated. Nonradiative process among 5G6,3K8,5F2,5F3 and 5S2 ( 5F4) was investigated by measuring the emission intensity and fluorescence lifetime at differenttemperatures. 5G6, 3K8, 5F2 and 5F3 are in thermal equilibrium and there are 5 phononsparticipating in the multiphonon relaxation between 5F3 and 5S2( 5F4).
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