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薄膜厚度对La1.85Sr0.15CuO4薄膜结构和超导电性的影响

祖 敏 张鹰子 闻海虎

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薄膜厚度对La1.85Sr0.15CuO4薄膜结构和超导电性的影响

祖 敏, 张鹰子, 闻海虎

The effect of thickness on the structure and superconductivity of La1.85Sr0.15CuO4 films

Zu Min, Zhang Ying-Zi, Wen Hai-Hu
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  • 使用直流同轴磁控溅射法,在SrTiO3(STO)衬底上成功制备出c取向的La1.85Sr0.15CuO4(LSCO)超导薄膜.通过电输运测量系统和X射线衍射仪研究了薄膜厚度对LSCO(x=0.15)薄膜电学性质和晶体结构的影响.实验证明随着膜厚增加,(006)衍射峰的半高宽(Full Width at Half Maximum,FWHM)逐渐减小,薄膜的取向性增强,与此同时,薄膜的超导转变温
    Highly c-oriented La1.85Sr0.15CuO4 (LSCO) films were successfully deposited on SrTiO3 (STO) substrates by on-axis magnetron sputtering. By using the standard four-probe technique and X-ray diffraction (XRD), we investigated the influence of film thickness on the structure and superconductivity of LSCO(x=0.15) films. The experiment results show that the full-width at half maximum (FWHM) of the (006) rocking curve decreases with increasing film thickness, which indicates that the crystal qualities of films are improved. Meanwhile, the superconducting transition temperature is higher for the thicker films.
    • 基金项目: 国家重点基础研究发展计划(973)项目(批准号:2006CB601000,2006CB921802)资助的课题.
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  • 文章访问数:  7693
  • PDF下载量:  936
  • 被引次数: 0
出版历程
  • 收稿日期:  2008-04-22
  • 修回日期:  2008-05-12
  • 刊出日期:  2008-11-20

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