[1] |
Wang SongWen, Guo HongXia, Ma Teng, Lei ZhiFeng, Ma WuYing, Zhong XiangLi, Zhang Hong, Lu XiaoJie, Li JiFang, Fang JunLin, Zeng TianXiang. Electrical stress of graphene field effect transistor under different bias voltages Reliability studies. Acta Physica Sinica,
2024, 73(23): .
doi: 10.7498/aps.20241365
|
[2] |
Yu Xue-Ling, Chen Feng-Xiang, Xiang Tao, Deng Wen, Liu Jia-Ning, Wang Li-Sheng. Research on the photoelectric modulation and resistive switching characteristic of ReSe2/WSe2 memtransistor. Acta Physica Sinica,
2022, 0(0): .
doi: 10.7498/aps.7120221154
|
[3] |
Gu Zhao-Qiao, Guo Hong-Xia, Pan Xiao-Yu, Lei Zhi-Feng, Zhang Feng-Qi, Zhang Hong, Ju An-An, Liu Yi-Tian. Total dose effect and annealing characteristics of silicon carbide field effect transistor devices under different stresses. Acta Physica Sinica,
2021, 70(16): 166101.
doi: 10.7498/aps.70.20210515
|
[4] |
Li Zhi-Peng, Li Jing, Sun Jing, Liu Yang, Fang Jin-Yong. High power microwave damage mechanism on high electron mobility transistor. Acta Physica Sinica,
2016, 65(16): 168501.
doi: 10.7498/aps.65.168501
|
[5] |
Wang Chong, Zhao Meng-Di, Pei Jiu-Qing, He Yun-Long, Li Xiang-Dong, Zheng Xue-Feng, Mao Wei, Ma Xiao-Hua, Zhang Jin-Cheng, Hao Yue. Enhancement mode AlGaN/GaN double heterostructure high electron mobility transistor with F plasma treatment. Acta Physica Sinica,
2016, 65(3): 038501.
doi: 10.7498/aps.65.038501
|
[6] |
Tan Ji, Zhu Yang-Jun, Lu Shuo-Jin, Tian Xiao-Li, Teng Yuan, Yang Fei, Zhang Guang-Yin, Shen Qian-Xing. Modeling and simulation of the insulated gate bipolar transistor turn-off voltage slope under inductive load. Acta Physica Sinica,
2016, 65(15): 158501.
doi: 10.7498/aps.65.158501
|
[7] |
Shi Lei, Feng Shi-Wei, Shi Bang-Bing, Yan Xin, Zhang Ya-Min. Degradation induced by voltage and current for AlGaN/GaN high-electron mobility transistor under on-state stress. Acta Physica Sinica,
2015, 64(12): 127303.
doi: 10.7498/aps.64.127303
|
[8] |
Liu Jing, Guo Fei, Gao Yong. Mechanism and characteristic analysis and optimization of SiGeC heterojunction bipolar transistor with super junction. Acta Physica Sinica,
2014, 63(4): 048501.
doi: 10.7498/aps.63.048501
|
[9] |
Wang Yuan, Zhang Li-Zhong, Cao Jian, Lu Guang-Yi, Jia Song, Zhang Xing. Research on electrostatic discharge characteristics of tunnel field effect transistors. Acta Physica Sinica,
2014, 63(17): 178501.
doi: 10.7498/aps.63.178501
|
[10] |
Sun Ya-Bin, Fu Jun, Xu Jun, Wang Yu-Dong, Zhou Wei, Zhang Wei, Cui Jie, Li Gao-Qing, Liu Zhi-Hong. Study on ionization damage of silicon-germanium heterojunction bipolar transistors at various dose rates. Acta Physica Sinica,
2013, 62(19): 196104.
doi: 10.7498/aps.62.196104
|
[11] |
Ren Xing-Rong, Chai Chang-Chun, Ma Zhen-Yang, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei. The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the base. Acta Physica Sinica,
2013, 62(6): 068501.
doi: 10.7498/aps.62.068501
|
[12] |
Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistor. Acta Physica Sinica,
2012, 61(23): 237104.
doi: 10.7498/aps.61.237104
|
[13] |
Hong Wu, Liang Lin, Yu Yue-Hui. Two-step switching method improved turn-on characteristic in reversely switching dynistor. Acta Physica Sinica,
2012, 61(5): 058501.
doi: 10.7498/aps.61.058501
|
[14] |
You Hai-Long, Lan Jian-Chun, Fan Ju-Ping, Jia Xin-Zhang, Zha Wei. Research on characteristics degradation of n-metal-oxide-semiconductor field-effect transistor induced by hot carrier effect due to high power microwave. Acta Physica Sinica,
2012, 61(10): 108501.
doi: 10.7498/aps.61.108501
|
[15] |
Wang Xiong, Cai Xi-Kun, Yuan Zi-Jian, Zhu Xia-Ming, Qiu Dong-Jiang, Wu Hui-Zhen. Study of zinc tin oxide thin-film transistor. Acta Physica Sinica,
2011, 60(3): 037305.
doi: 10.7498/aps.60.037305
|
[16] |
Chai Chang-Chun, Xi Xiao-Wen, Ren Xing-Rong, Yang Yin-Tang, Ma Zhen-Yang. The damage effect and mechanism of the bipolar transistor induced by the intense electromagnetic pulse. Acta Physica Sinica,
2010, 59(11): 8118-8124.
doi: 10.7498/aps.59.8118
|
[17] |
Yang Sheng-Yi, Du Wen-Shu, Qi Jie-Ru, Lou Zhi-Dong. Optoelectronic characteristics of NPB-based vertical organic light-emitting transistors. Acta Physica Sinica,
2009, 58(5): 3427-3432.
doi: 10.7498/aps.58.3427
|
[18] |
Yuan Guang-Cai, Xu Zheng, Zhao Su-Ling, Zhang Fu-Jun, Xu Na, Sun Qin-Jun, Xu Xu-Rong. Study of the characteristics of organic thin film transistors with phenyltrimethoxysilane buffer under low gate modulation voltage. Acta Physica Sinica,
2009, 58(7): 4941-4947.
doi: 10.7498/aps.58.4941
|
[19] |
Li Xiao, Zhang Hai-Ying, Yin Jun-Jian, Liu Liang, Xu Jing-Bo, Li Ming, Ye Tian-Chun, Gong Min. Research of breakdown characteristic of InP composite channel HEMT. Acta Physica Sinica,
2007, 56(7): 4117-4121.
doi: 10.7498/aps.56.4117
|
[20] |
Shu Bin, Zhang He-Ming, Hu Hui-Yong, Xuan Rong-Xi, Dai Xian-Ying. Mathematical model of DC characteristic of SiGe charge injection transistors. Acta Physica Sinica,
2007, 56(2): 1105-1109.
doi: 10.7498/aps.56.1105
|