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Fuping Zhang, Xiqing Li, Jinmei Du, Yusheng Liu, Fuqing Ye. Failure distribution and reliable analysis of ferroelectric ceramics under pulsed electric field. Acta Physica Sinica,
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Zhou Hang, Cui Jiang-Wei, Zheng Qi-Wen, Guo Qi, Ren Di-Yuan, Yu Xue-Feng. Reliability of partially-depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistor under the ionizing radiation environment. Acta Physica Sinica,
2015, 64(8): 086101.
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Jiang Xian-Wei, Dai Guang-Zhen, Lu Shi-Bin, Wang Jia-Yu, Dai Yue-Hua, Chen Jun-Ning. Effect of Al doping on the reliability of HfO2 as a trapping layer: First-principles study. Acta Physica Sinica,
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Li Ri, Wang Jian, Zhou Li-Ming, Pan Hong. The reliability analysis of using the volume averaging method to simulate the solidification process in a ingot. Acta Physica Sinica,
2014, 63(12): 128103.
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Rao Zhong-Hao, Wang Shuang-Feng, Zhang Yan-Lai, Peng Fei-Fei, Cai Song-Heng. Molecular dynamics simulation of the thermophysical properties of phase change material. Acta Physica Sinica,
2013, 62(5): 056601.
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Wang Xin-Hua, Wang Jian-Hui, Pang Lei, Chen Xiao-Juan, Yuan Ting-Ting, Luo Wei-Jun, Liu Xin-Yu. Reliability of SiN-based MIM capacitors in GaN MMIC. Acta Physica Sinica,
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2011, 60(2): 021201.
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2009, 58(9): 6074-6079.
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Luan Su-Zhen, Liu Hong-Xia, Jia Ren-Xu. The dynamic reliability of ultra-thin gate oxide and its breakdown characteristics. Acta Physica Sinica,
2008, 57(4): 2524-2528.
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Zhang Yi-Min, Zhang Xu-Fang. Reliability analysis of double random Duffing system. Acta Physica Sinica,
2008, 57(7): 3989-3995.
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Yang Hong, Chen Min. A molecular dynamics simulation of thermodynamic properties of undercooled liquid Ni2TiAl alloy. Acta Physica Sinica,
2006, 55(5): 2418-2421.
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Hu Jin, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, Zhou Jiang. Noise as a representation for reliability of light emitting diode. Acta Physica Sinica,
2006, 55(3): 1384-1389.
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Zhao Yi, Wan Xing-Gong. Substrate and process dependence of gate oxide reliability of 0.18μm dual gate CMOS process. Acta Physica Sinica,
2006, 55(6): 3003-3006.
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Gu Shu-Long, Zhang Hong-Bin. Mei symmetry, Noether symmetry and Lie symmetry of a Vacco system. Acta Physica Sinica,
2005, 54(9): 3983-3986.
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Cui Shou-Xin, Cai Ling-Cang, Hu Hai-Quan, Guo Yong-Xin, Xiang Shi-Kai, Jing Fu-Qian. Molecular dynamics simulation for thermophysical parameters of sodium chloride solids at high temperature and high pressure. Acta Physica Sinica,
2005, 54(6): 2826-2831.
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CHAI ZHEN-MING. RELIABILITY OF CIRCUIT ELEMENTS BY REDUNDANCY METHOD. Acta Physica Sinica,
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